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Refractometric biosensing based on optical phase flips in sparse and short-range-ordered nanoplasmonic layers

Light(Science & Applications) 2014年第1期3卷 20-26页

作者： Mikael Svedendahl ruggero verre Mikael Kall Department of Applied Physics Chalmers University of Technology41296 GoteborgSweden

Noble metal nanoparticles support localized surface plasmon resonances(LSPRs)that are extremely sensitive to the local dielectric properties of the environment within distances up to 10–100 nm from the metal *** significant overlap between the sensing volume of the nanoparticles and the size of biological macromolecules has made LSPR biosensing a key field for the application of *** advancements in evaluating plasmonic refractometric sensors have suggested that the phase detection of light can surpass the sensitivity of standard intensity-based detection ***,we experimentally confirm that the phase of light can be used to precisely track local refractive index changes induced by biomolecular reactions,even for dilute and layers of short-range-ordered plasmonic *** particular,we demonstrate that the sensitivity can be enhanced by tuning in to a zero reflection condition,in which an abrupt phase flip of the reflected light is *** a cost-effective interference fringe tracking technique,we demonstrate that phase measurements yield an approximately one order of magnitude larger relative shift compared with traditional LSPR measurements for the model system of NeutrAvidin binding to biotinylated nanodisks.

关键词： biosensors interferometry metasurfaces nanostructures spectroscopy

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Investigation of coupled cobalt-silver nanoparticle system by plan view TEM

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Progress in Natural Science:Materials International 2012年第3期22卷 186-192页

作者： Daniel Fox ruggero verre Brendan J. O'Dowd Sunil K. Arora Colm C. Faulkner Igor V. Shvets School of Physics and CRANN Trinity College Dublin CRANN Advanced Microscopy Laboratory Trinity College Dublin

We present a transmission electron microscopy (TEM) investigation of a coupled cobalt and silver nanoparticle system. A plan view in situ lift-out method for preparing samples for TEM using the focused ion beam (FIB) microscope was used. This technique is used to prepare high quality TEM samples with site specificity in a short time and with a high success rate. We demonstrate the ability of the plan view sample preparation technique to provide information about an ordered system of nanoparticles which could not be observed using standard FIB cross sectioning of the sample. High resolution TEM and energy dispersive X-ray spectroscopy mapping of both cross sectional and plan view samples are presented, clearly showing the significant benefit of plan view TEM analysis for certain samples.

关键词： Focused ion beam Transmission electron microscopy Lift-out Co Ag Nanoparticle

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