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Forma.ion of Pla.inum (Pt) Na.ocluster Coa.ings on K-OMS-2 Ma.ga.ese Oxide Membra.es by Rea.tive Spra. Deposition Technique (RSDT) for Extended Sta.ility during CO Oxida.ion

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a.va.ces in Chemica. Engineering a.d Science 2014年第1期4卷 23-35页

作者： Hector F. Ga.ces Justin Roller Cecil K. King’ondu Sa.inda.Dha.ma.a.hna.roger a. ristau Risha.h Ja.n Ra.enka.Ma.ic Steven L. Suib Depa.tment of Chemistry University of Connecticut Storrs USA Depa.tment of Chemistry University of Connecticut Storrs USA Institute of Ma.eria.s Science University of Connecticut Storrs USA Depa.tment of Ma.eria.s Science & Engineering University of Connecticut Storrs USA Center for Clea. Energy Engineering University of Connecticut Storrs USA Depa.tment of Ma.eria.s Science & Engineering University of Connecticut Storrs USA Center for Clea. Energy Engineering University of Connecticut Storrs USA Chemica. a.d Biomolecula. Engineering Depa.tment University of Connecticut Storrs US Depa.tment of Susta.na.le Energy Science a.d Engineering Nelson Mandela African Institution of Science and Technology Arusha Tanzania Institute of Ma.eria.s Science University of Connecticut Storrs USA School of Engineering Brown University Providence USA

Na.ocluster forma.ion of a.meta.lic pla.inum (Pt) coa.ing, on ma.ga.ese oxide inorga.ic membra.es impregna.ed with multiwa.l ca.bon na.otubes (K-OMS-2/MWCNTs), a.plied by rea.tive spra. deposition technology (RSDT) is discussed. RSDT a.plies thin films of Pt na.oclusters on the substra.e;the thickness of the film ca. be ea.ily controlled. The K-OMS-2/MWCNTs fibers were enclosed by the thin film of Pt. X-ra. diffra.tion (XRD), sca.ning electron microscopy/X-ra. energy dispersive spectroscopy (SEM/XEDS), focus ion bea./sca.ning electron microscopy (FIB/SEM), tra.smission electron microscopy (TEM), a.d X-ra. 3D micro-tomogra.hy (MicroXCT) which ha.e been used to cha.a.terize the resulta.t Pt/K-OMS-2/MWCNTs membra.e. The non-destructive cha.a.teriza.ion technique (MicroXCT) resolves the Pt la.er on the upper la.er of the composite membra.e a.d a.so shows tha. the membra.e is composed of sheets superimposed into sta.ks. The na.ostructured coa.ing on the composite membra.e ma.eria. ha. been eva.ua.ed for ca.bon monoxide (CO) oxida.ion. The functiona.ized Pt/K-OMS-2/MWCNTs membra.es show excellent conversion (100%) of CO to CO2 a. a.lower tempera.ure 200℃ compa.ed to the uncoa.ed K-OMS-2/MWCNTs. Moreover, the Pt/K-OMS-2/MWCNTs membra.es show outsta.ding sta.ility, of more tha. 4 da.s, for CO oxida.ion a. 200℃.

关键词： Ma.ga.ese Oxide Membra.e Pt Na.ostructures Rea.tive Spra. Deposition Technology (RSDT) Film Deposition X-Ra. Tomogra.hy

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Sta.da.diza.ion in optica. coa.ing cha.a.terisa.ion

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光学精密工程 2005年第4期13卷 435-453页

作者： D. ristau La.er Zentrum Ha.nover 30419 Hannover Germany

In the ra.id development course of la.er technology a.d modern optics, optica. metrology continuously ga.ns importa.ce for the qua.ity ma.a.ement in the industria. production environment a.d a.so for resea.ch in optica. coa.ings. Besides a.sorption a.d sca.ter losses, the spectra. cha.a.teristics a.d la.er induced da.a.e thresholds a.e considered a. common qua.ity fa.tors for coa.ed optica. components a.d often define the optimiza.ion ta.gets for new products a.d a.plica.ions. a.so, these qua.ity pa.a.eters a.e the ba.is for the compa.ison of commercia. optics a.d ca. be found in the product ca.a.ogues of most ma.ufa.turers of optica. components. a. a.consequence, sta.da.diza.ion of cha.a.terisa.ion procedures for these funda.enta. properties evolved to a.crucia. point for the optics industry. During the la.t deca.e, a.a.ted sta.da.d mea.urement techniques ha.e been ela.ora.ed a.d discussed by representa.ives from ma.y industria. compa.ies a.d resea.ch institutes within working groups of the Interna.iona. Orga.isa.ion for Sta.da.diza.ion (ISO). In this contribution, the current sta.e of sta.da.dized cha.a.terisa.ion techniques for optica. coa.ings is summa.ised. Selected sta.da.ds for the mea.urement of a.sorption (ISO 11551), sca.tering (ISO 13696) a.d la.er induced da.a.e thresholds (ISO 11254, Pa.ts 1 a.d 2) will be described a.d discussed in view of their a.plica.ility a.d reproducibility. The report will be concluded by a. outlook on the current projects a.d future ta.ks of sta.da.diza.ion in optics cha.a.terisa.ion.

关键词：光学涂覆技术激光技术光谱标准化激光仪器

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Optica. broa.ba.d monitoring of thin film growth

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光学精密工程 2005年第4期13卷 403-412页

作者： H. Ehlers T. Groβ M. La.pschies D. ristau La.er Zentrum Ha.nover Hollerithallee 8 30419 Hannover GermanyLaser Zentrum Hannover Hollerithallee 8 30419 Hannover GermanyLaser Zentrum Hannover Hollerithallee 8 30419 Hannover GermanyLaser Zentrum Hannover Hollerithallee 8 30419 Hannover Germany

This contribution is focused on a.plica.ions of spectroscopic methods for the precise control of deposition processes. In this context, the present study gives a.review on selected combina.ions of conventiona. a.d ion deposition techniques with different broa.ba.d online spectrophotometric systems. Besides two systems opera.ing in the VIS- a.d NIR-spectra. ra.ge in combina.ion with ion processes, a.so a.monochroma.or system developed for conventiona. deposition processes in the DUV/VUV-spectra. ra.ge will be discussed. The considera.ions will be concluded by a.compa.ison of the ma.or a.va.ta.es of the specific combina.ions of processes with online monitoring concepts a.d by a.brief outlook concerning future cha.lenges.

关键词：宽带光学涂覆技术薄膜分光镜

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a.va.ced control a.d modeling of deposition processes

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Chinese Optics Letters 2013年第13期11卷 30-35页

作者： Detlev ristau Henrik Ehlers Centre of Qua.tum Engineering a.d Spa.e-Time Resea.ch Hannover Germany Depa.tment of La.er Components Laser Zentrum Hannover e.V. Hannover Germany

During the la.t deca.e, striking improvements could be a.hieved for the precise control of deposition processes in optica. coa.ing technology. For exa.ple, a. a.consequence of enormous progresses in mea.ure- ment a.d computer technology, direct optica. monitoring in a.broa. spectra. ra.ge ca. be considered a. a.common tool in ma.y production environments nowa.a.s. Besides the development of the corresponding ha.dwa.e a.d mea.urement cha.nels, a.va.ced a.proa.hes for the eva.ua.ion of the a.quired da.a.a.d new multiple sensor monitoring stra.egies moved into the focus of modern resea.ch on the wa. towa.ds de- terministic deposition techniques. In this context, a.so innova.ive concepts for the simula.ion of deposition processes to foreca.t the result for a.specified coa.ing design a.d a.toma.ic online correction a.gorithms ga.ned of importa.ce to reduce the risk of fa.lure in coa.ing production. The present contribution will be dedica.ed to selected a.pects in this field, especia.ly a.dressing broa. ba.d optica. monitoring systems. a.short review on exa.ples for existing ha.dwa.e configura.ions a.d softwa.e tools will be presented illus- tra.ing the a.va.ta.es of modern process control techniques. Novel a.proa.hes ba.ed on the modeling of thin film growth a.e discussed a. a. a.ditiona. stra.egy to improve the predicta.ility of coa.ing processes.

关键词： 310.1860 Deposition a.d fa.rica.ion 310.6845 Thin film devices a.d a.plica.ions 280.4788 Optica. sensing a.d sensors

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Spa.ia. sepa.a.ion effects in a.guiding procedure in a.modified ion-bea.-sputtering process

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Light(Science & a.plica.ions) 2015年第1期4卷 109-116页

作者： Sina.Ma.oba.ic Ma.co Jupé Detlev ristau La.er Zentrum Ha.nover e.V. Hollerithallee 8D-30419 HannoverGermany QUEST:Centre for Qua.tum Engineering a.d Spa.e-Time Resea.ch Leibniz Universität HannoverHannoverGermany

In the present sta.e of the a.t,ion bea. sputtering is used to produce low-loss dielectric *** the ma.ufa.turing of a.dielectric la.er sta.k,the deposition ma.eria. must be cha.ged,which requires ra.id mecha.ica. movement of va.uum *** mecha.ica. components ca. be rega.ded a. a.risk fa.tor for conta.ina.ion during the coa.ing process,which limits the qua.ity of high-end la.er *** minimize the pa.ticle conta.ina.ion,we present a.novel deposition concept tha. does not require mova.le components to cha.ge the coa.ing ma.eria. during the coa.ing process.a.ma.netic field guiding technique ha. been developed,which ena.les the tuning of the refra.tive index in the la.er structure by sputtering mixtures with va.ying compositions of two ma.eria.s using a.single-ion *** versa.ility of this new concept is demonstra.ed for a.highreflection mirror.

关键词： EM field sepa.a.ion ion bea. sputtering pla.ma.guiding

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激光量热法测量光学薄膜微弱吸收

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中国激光 2006年第6期33卷 823-826页

作者：李斌成熊胜明 Holger Bla.chke Detlev ristau 中国科学院光电技术研究所四川成都610041 汉诺威激光中心德国汉诺威30419

按照国际标准ISO 11551研制了用于测量光学薄膜微弱吸收的激光量热装置。典型情况下吸收测量灵敏度优于10-6,测量误差估计为10%左右。在1064 nm波长测量1 mm厚石英玻璃基板的绝对吸收为3.4×10-6,测量灵敏度达到1.5×10-7。测量了不同... 详细信息

按照国际标准ISO 11551研制了用于测量光学薄膜微弱吸收的激光量热装置。典型情况下吸收测量灵敏度优于10-6,测量误差估计为10%左右。在1064 nm波长测量1 mm厚石英玻璃基板的绝对吸收为3.4×10-6,测量灵敏度达到1.5×10-7。测量了不同膜层设计、不同使用角度、不同镀膜技术镀制的全介质高反膜样品;使用离子束溅射(IBS)技术镀制的Ta.O5/SiO2多层0°反射镜的吸收仅为1.08×10-5,而使用离子束辅助沉积(Ia.)技术镀制的HfO2/SiO2多层45°反射镜的吸收测量值为6.83×10-5。

关键词：测量技术微弱吸收激光量热法光学薄膜

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COMPa.ING EURO-NORMS TO MILITa.Y STa.Da.DS

COMPARING EURO-NORMS TO MILITARY STANDARDS

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1997 Interna.iona. Symposium on Electroma.netic Compa.ibility

作者： Dietha.d Ha.sen Detlef ristau EURO EMC SERVICE（EES） Dr.Ha.sen GmbH Potsda.er Str.18A D-14513 TeltowGermany

＜正＞a.compa.ison of commercia. euro-sta.da.ds a.d interna.iona. milita.y sta.da.ds is ma.e with respect to dua. purpose equipment a.d CE certifica.ion under the Europea. EMC directive 89/336/EEC. *** Europe ha. implemented equa. lega. a.d norma.ive conditions for tra.e（import,export） throughout the Europea. Union,which

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Wa.erproof coa.ings for high-power la.er ca.ities

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Light(Science & a.plica.ions) 2019年第1期8卷 1063-1068页

作者： Xinbin Cheng Siyu Dong Song Zhi Seba.tia. Pa.chel Istva. Ba.a.a.Detlev ristau Zha.sha. Wa.g MOE Key La.ora.ory of a.va.ced Micro-Structured Ma.eria.s Shanghai 200092China Institute of Precision Optica. Engineering School of Physics Science and EngineeringTongji UniversityShanghai 200092China IFSa.Colla.ora.ive Innova.ion Center Shanghai Jiao Tong UniversityShanghai 200240China La.er Zentrum Ha.nover e.V. Laser Components DepartmentHannover 30419Germany

With the ever-increa.ing la.er power a.d repetition ra.e,therma. control of la.er media.is becoming increa.ingly *** for widely used a.r cooling or a.bonded hea. sink,wa.er cooling of a.la.er medium is more effective in removing wa.te ***,how to protect deliquescent la.er media.from wa.er erosion is a.cha.lenging ***,novel wa.erproof coa.ings were proposed to shield Nd:Gla.s from wa.er *** cla.ifying the dependence of the wa.erproof property of single la.ers on their microstructures a.d pore cha.a.teristics,na.ocomposites tha. dope SiO_(2) in HfO_(2) were synthesized using a. ion-a.sisted co-eva.ora.ion process to solve the issue of a.la.k of a.highindex ma.eria. tha. simulta.eously ha. a.dense a.orphous microstructure a.d wide ***_(0.7)Si_(0.3)O_(2)/SiO_(2) multifunctiona. coa.ings were fina.ly shown to possess a. excellent wa.erproof property,high la.er-induced da.a.e threshold(LIDT)a.d good spectra. performa.ce,which ca. be used a. the ena.ling components for therma. control in high-power la.er ca.ities.

关键词： power high property

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激光薄膜特性参数测试方法标准化进展(特邀)

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光子学报 2022年第9期51卷 32-41页

作者：李斌成王静 ristau Detlev 电子科技大学光电科学与工程学院成都610054 汉诺威莱布尼兹大学量子光学研究所德国汉诺威30167

综述了近年来激光薄膜元件反射率/透过率、吸收损耗、散射损耗和激光损伤阈值等主要性能参数测试方法的标准化进展。重点分析了分光光度法、激光比率法和光腔衰荡法三种标准的反射率/透过率测试方法的优缺点,指出了分光光度法和光腔衰... 详细信息

综述了近年来激光薄膜元件反射率/透过率、吸收损耗、散射损耗和激光损伤阈值等主要性能参数测试方法的标准化进展。重点分析了分光光度法、激光比率法和光腔衰荡法三种标准的反射率/透过率测试方法的优缺点,指出了分光光度法和光腔衰荡法的适用范围。分析了激光量热法测量薄膜元件吸收损耗的优点和不足,介绍了正在制定中的光热吸收测量国际标准的主要内容和进展情况,明确激光量热法主要适用于实验室薄膜元件吸收损耗绝对值的确定,而光热法更适用于大口径元件吸收损耗的确定和吸收型缺陷分布的成像测量。介绍了激光损伤阈值测试方法目前正在修订版本的主要技术内容和区别,修订后的激光损伤阈值测试方法国际标准将考虑客户的测试要求,测试结果可更满足工程应用需求。最后介绍了中国主持国际标准制定修订情况及国际标准在中国的转化情况。

关键词：标准化测试方法激光损伤阈值反射率/透过率吸收损耗散射损耗

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大功率激光器的光学镀膜问题

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光机情报 1990年第10期7卷 26-32页

作者： ristau,D 大舟

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