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Structural and optical analysis of Cr_2N thin films prepared by DC magnetron sputtering

International Journal of Minerals,Metallurgy and Materials 2015年第2期22卷 197-202页

作者： Shakil Khan A.Mahmood A.Shah qaiser raza Muhammad Asim Rasheed Ishaq Ahmad Department of Metallurgy and Materials Engineering Pakistan Institute of Engineering and Applied Sciences National Institute of Laser and Optronics (NILOP) National Centre for Physics Quaid-i-Azam University

Chromium nitride （Cr2N） thin films were prepared by a DC magnetron sputtering technique. The deposition temperature was raised from 50 to 300℃, and its influence on the film structure and refractive index was investigated. X-ray diffraction analysis shows that the crystalline strucure of the films transforms from the （101） to （002） oriented hexagonal CrzN phase as the increase of substrate tempera- ture above 50℃, and a highly texatred film grows at 100℃. An empirical relation between the crystalline orientation and infrared active modes of the films is obtained, i.e., the Fourier transform infrared （FTIR） spectrum of the film prepared at 50℃ exhibits only A1 （TO） mode. The prominent peak in the FTIR spectra of the film prepared above 50℃is assigned to the E1 （TO） mode and is correlated with the （002） or c-axis oriented hexagonal wurtzite phase of Cr2N. In the surface analysis of atomic force microscopy, a transformation from the featureless surface to columnar-type morphology is observed with the increase of substrate temperature from 50 to 100℃, exhibiting c-axis oriented crystallite growth. A further increase in substrate temperature to 200℃ causes the c-axis crystallites to merge, resulting in the formation of voids. The refractive index （n） of the deposited films is obtained using spectroscopic ellipsometry.

关键词： chromium nitride thin films magnetron sputtering structural analysis optical analysis refractive index

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Structural and optical properties of Zn1-xNixTe thin films prepared by electron beam evaporation technique

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Progress in Natural Science:Materials International 2015年第1期25卷 22-28页

作者： Arshad Mahmood R. Rashid U. Aziz A. Shah Zahid Ali qaiser raza Tanveer Ashraf Nano Devices Laboratories National Institute of Lasers and Optronics (NILOP) P.O. Nilore Islamabad Pakistan

Zn1-xNixTe thin films with different composition(x=0.0, 0.05, 0.10, 0.15 and 0.20) were deposited on glass substrate by electron beam evaporation technique followed by its characterization using advanced structural and optical analysis techniques. Structural properties of the prepared thin films were studied by X-ray diffraction(XRD). The XRD patterns revealed that the binary compounds transformed into a ternary compound with cubic structure having preferred orientation along the c-direction with(111) planes. Composition analysis of the films was determined by energy dispersive analysis of X-rays(EDAX) and found to be in agreement with the precursor composition. Optical properties such as extinction coefficient(k) and band gap energy of these films were examined by using a spectroscopic ellipsometer. It was found that the extinction coefficient(k) increased with the addition of Ni content in the alloy. In comparison, the band gap energy was also determined by using transmission spectra and found to be agreed with that of the ellipsometric results. These analyses confirm that the band gap energy decreases with the increase of Ni content in the alloy.

关键词： E-beam evaporation Solar cells,Zn1-xNixTe Ellipsometry Extinction coefficient Band gap energy

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