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Combining infrared and mode synthesizing atomic force microscopy： Application to the study of lipid vesicles inside Streptomyces bacteria

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Nano Research 2016年第6期9卷 1674-1681页

作者： pauline vitry Rolando Rebois Eric Bourillot Ariane Deniset-Besseau Marie-Joelle Virolle~ Eric Lesniewska Alexandre Dazzi ICB UMR CNRS 6303 University ofBourgogne Franche Comte 21078 Dijon France LCP UMR CNRS 8000 University Paris-Sud 91405 Orsay France 12BC UMR CNRS 9198 University Paris-Sud 91190 Gif-Sur-Yvette France

We propose a new analytical approach combining vibrational spectroscopy and acoustic tomography for the detection and characterization of vesicles inside Streptomyces bacteria. Using atomic force microscopy and infrared spectroscopy （AFM-IR）, we detect the presence of triglyceride vesicles. Their sizes in depth are measured with high accuracy using mode synthesizing atomic force microscopy （MS-AFM）. We conducted a comparative study of AFM-IR and MS-AFM, and highlighted the advantages of the coupling of these techniques in having a full characterization （chemical, topographical, and volumetric） of a biological sample. With these complementary techniques, a complete access to the vesicle size distribution has been achieved with an accuracy of less than 50 nm. A 3D reconstruction of bacteria showing the in-depth distribution of vesicles is given to underline the great potential of the acoustic method.

关键词： nanoscale suDsurtace imaging atomic force microscop~ acoustic microscopy infrared microscopy biology

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Mode-synthesizing atomic force microscopy for 3D reconstruction of embedded low-density dielectric nanostructures

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Nano Research 2015年第7期8卷 2199-2205页

作者： pauline vitry Eric BouriUot Cedric Plassard Yvon Lacroute Eric Calkins Laurene Tetard Eric Lesniewska Avenue Alain Savary UMR CNRS 6303 Physics Department University of Bourgogne 210786 Cedex France Nanoscience Technology Center University of Central Florida Orlando FL 32826 USA Department of Physics University of Central Florida Orlando FL 32826 USA

Challenges in nanoscale characterization call for non-invasive, yet sensitive subsurface characterization of low-density materials such as polymers. In this work, we present new evidence that mode-synthesizing atomic force microscopy can be used to detect minute changes in low-density materials, such as those engendered in electro-sensitive polymers during electron beam lithography, surpassing all common nanoscale mechanical techniques. Moreover, we propose 3D reconstruction of the exposed polymer regions using successive high-resolution frames acquired at incremental depths inside the sample. In addition, the results clearly show the influence of increasing dwell time on the depth profile of the nano-sized exposed regions. Hence, the simple approach described here can be used for achieving sensitive nanoscale tomography of soft materials with promising applications in material sciences and biology.

关键词： na_noscale subsurface imaging tomic force microscopy,3D reconstruction, nanoscale tomography acoustic microscopy dielectic

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