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Shedding light on electrodeposition dynamics tracked in situ via soft X-ray coherent diffraction imaging

Nano Research 2016年第7期9卷 2046-2056页

作者： George Kourousias Benedetto Bozzini Alessandra Gianoncelli Michael W. M. Jones Mark Junker Grant van Riessen maya kiskinova Elettra Sincrotrone Trieste ScpA SS 14-km 163.5 in Area Science Park 34149 Trieste ltaly Dipartimento di Ingegneria dell'lnnovazione Universita del Salento via Monteroni 73100 Lecce Italy Australian Synchrotron Clayton 3168 Australia ARC Centre of Excellence for Advanced Molecular Imaging La Trobe Institute of Molecular Science La Trobe University Bundoora 3089 Australia Department of Chemistry and Physics La Trobe Institute for Molecular Science La Trobe University Bundoora 3086 Australia

The in situ physicochemical analysis of nanostructured functional materials is crucial for advances in their design and production. X-ray coherent diffraction imaging （CDI） methods have recently demonstrated impressive potential for characterizing such materials with a high spatial resolution and elemental sensitivity; however, moving from the current ex situ static regime to the in situ dynamic one remains a challenge. By combining soft X-ray ptychography and single-shot keyhole CDI, we performed the first in situ spatiotemporal study on an electrodeposition process in a sealed wet environment, employed for the fabrication of oxygen-reduction catalysts, which are key components for alkaline fuel cells and metal-air batteries. The results provide the first experimental demonstration of theoretically predicted Turing-Hopf electrochemical pattern formation resulting from morphochemical coupling, adding a new dimension for the in-depth in situ characterization of electrodeposition processes in space and time.

关键词： in situ electrodeposition X-ray coherent diffractionimaging keyhole coherentdiffraction imaging (CDI) X-ray ptychography

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Contactless Monitoring of the Diameter-Dependent Conductivity of GaAs Nanowires

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Nano Research 2010年第10期3卷 706-713页

作者： Fauzia Jabeen Silvia Rubini Faustino Martelli Alfonso Franciosi Andrei Kolmakov Luca Gregoratti Matteo Amati Alexei Barinov Andrea Goldoni maya kiskinova Sincrotrone Trieste S.C.P.A. Elettra LaboratoryArea Science ParkS.S.14Km.163.5I-34149 TriesteItaly Laboratorio TASC IOM-CNR Area Science ParkS.S.14Km.163.5I-34149 TriesteItaly Department of Physics Southern Illinois University Carbondale1245 Lincoln Dr.Neckers 478CarbondaleIL 62901-4401USA

Contactless monitoring with photoelectron microspectroscopy of the surface potential along individual nano-structures,created by the X-ray nanoprobe,opens exciting possibilities to examine quantitatively size-and surface-chemistry-effects on the electrical transport of semiconductor nanowires(NWs).Implementing this novel approach-which combines surface chemical microanalysis with conductivity measurements-we explored the dependence of the electrical properties of undoped GaAs NWs on the NW width,temperature and surface *** following the evolution of the Ga 3d and As 3d core level spectra,we measured the position-dependent surface potential along the GaAs NWs as a function of NW diameter,decreasing from 120 to~20 nm,and correlated the observed decrease of the conductivity with the monotonic reduction in the NW diameter from 120 to~20 *** of the GaAs NWs to oxygen ambient leads to a decrease in their conductivity by up to a factor of 10,attributed to the significant decrease in the carrier density associated with the formation of an oxide shell.

关键词： Semiconductor nanowires charge transport surface oxidation photoelectron X-ray microscopy charging GaAs

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