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Oral cyclophosphamide-induced posterior reversible encephalopathy syndrome in a patient with ANCA-associated vasculitis:A case report

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World Journal of Clinical Cases 2021年第21期9卷 6130-6137页

作者： Yire Kim jihye kwak Sehyun Jung Seunghye Lee Ha Nee Jang Hyun Seop Cho Se-Ho Chang Hyun-Jung Kim Internal Medicine Gyeongsang National University HospitalJinju 52727South Korea Institute of Health Sciences Gyeongsang National UniversityJinju 52727South Korea Internal Medicine College of MedicineGyeongsang National UniversityJinju 52727South Korea

BACKGROUND Posterior reversible encephalopathy syndrome(PRES)manifests many neurological symptoms with typical features on neuroimaging studies and has various risk *** is one of the therapeutic agents for antineutrophil cytoplasmic antibody(ANCA)-associated *** as the sole cause of PRES has been reported in only a few ***,we report a unique case of early-onset oral cyclophosphamide-induced PRES in a patient with ANCA-associated *** SUMMARY A 73-year-old man was transferred to our hospital for sepsis due to acute *** had already received hemodialysis for two weeks due to septic acute kidney *** azotemia was not improved after sepsis resolved and perinuclear-ANCA was *** biopsy showed crescentic *** hemorrhage was observed on *** was initially treated with intravenous methylprednisolone and plasma exchange for one *** then,two days after adding oral cyclophosphamide,the patient developed generalized tonic-clonic *** diagnosed PRES by Brain magnetic resonance imaging(MRI)and *** were controlled with fosphenytoin 750 *** was suspected to be the cause of PRES and *** mentality was recovered after seven days and brain MRI showed normal state after two *** The present case shows the possibility of PRES induction due to short-term use of oral cyclophosphamide *** should carefully monitor neurologic symptoms after oral cyclophosphamide administration in elderly patients with underlying diseases like sepsis,renal failure and ANCA-associated vasculitis.

关键词： Cyclophosphamide Posterior reversible encephalopathy syndrome Antineutrophil cytoplasmic antibody-associated vasculitis Renal failure Case report

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Microsphere-assisted hyperspectral imaging:super-resolution,non-destructive metrology for semiconductor devices

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Light(Science & Applications) 2024年第6期13卷 1098-1111页

作者： Jangryul Park Youngsun Choi Soonyang Kwon Youngjun Lee Jiwoong Kim Jae-joon Kim jihye Lee Jeongho Ahn Hidong kwak Yusin Yang Taeyong Jo Myungjun Lee Kwangrak Kim Metrology and Inspection Equipment R&D Team Mechatronics ResearchSamsung Electronics Co.Ltd.1-1 Samsungjeonja-rohwaseong-siGyeonggi-do18848Republic of Korea Process Development Department DRAM Process Development TeamSemiconductor R&D CenterSamsung Electronics Co.Ltd.1-1 Samsungjeonja-rohwaseong-siGyeonggi-do18848Republic of Korea Process Development Department Semiconductor R&D CenterSamsung Electronics Co.Ltd.1-1 Samsungjeonja-rohwaseong-siGyeonggi-do18848Republic of Korea

As semiconductor devices shrink and their manufacturing processes advance,accurately measuring in-cell critical dimensions(CD)becomes increasingly *** test element group(TEG)measurements are becoming inadequate for representing the fine,repetitive patterns in cell *** non-destructive metrology technologies like optical critical dimension(OCD)are limited due to their large spot diameter of approximately 25μm,which impedes their efficacy for detailed in-cell structural ***,there is a pressing need for small-spot and non-destructive metrology *** address this limitation,we demonstrate a microsphere-assisted hyperspectral imaging(MAHSI)system,specifically designed for small spot optical metrology with *** microsphere-assisted super-resolution imaging,this system achieves an optical resolution of 66 nm within a field of view of 5.6μm×5.6μ*** approach effectively breaks the diffraction limit,significantly enhancing the magnification of the *** MAHSI system incorporating hyperspectral imaging with a wavelength range of 400–790 nm,enables the capture of the reflection spectrum at each camera *** achieved pixel resolution,which is equivalent to the measuring spot size,is 14.4 nm/pixel and the magnification is *** MAHSI system enables measurement of local uniformity in critical areas like corners and edges of DRAM cell blocks,areas previously challenging to inspect with conventional OCD *** our knowledge,this approach represents the first global implementation of microsphere-assisted hyperspectral imaging to address the metrology challenges in complex 3D structures of semiconductor devices.

关键词： metrology resolution enable

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