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Polarized Light Microscopy and Spectroscopy of Individual Single-Walled Carbon Nanotubes

Nano Research 2011年第8期4卷 788-794页

作者： jacques lefebvre paul finnie Institute for Microstructural Sciences National Research Council Ottawa Canada K IA 0R6

Polarized light microscopy （PLM） is used to image individual single-walled carbon nanotubes （SWNTs） suspended in air across a slit opening. The imaging contrast relies on the strong optical anisotropy typical of SWNTs. We combine PLM with a tunable light source to enable hyperspectral excitation spectroscopy and nanotube chirality assignment. Comparison with fluorescence microscopy and spectroscopy confirms the assignment made with PLM. This represents a versatile new approach to imaging SWNTs and related structures.

关键词： Carbon nanotube microscopy luminescence absorption polarization homodyne

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The Dynamics of the Nucleation, Growth and Termination of Single-Walled Carbon Nanotubes from in situ Raman Spectroscopy During Chemical Vapor Deposition

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Nano Research 2009年第10期2卷 783-792页

作者： paul finnie Andrew Li-Pook-Than jacques lefebvre Institute for Microstructural Sciences National Research Council CanadaBuilding M-501200 Montreal RoadOttawaONK1A 0R6Canada Department of Physics University of Ottawa150 Louis PasteurOttawaON K1N 6N5Canada

The dynamics of the chemical vapor deposition(CVD)of single-walled carbon nanotubes(SWNTs)is extracted experimentally using in situ Raman *** are grown using a thinlm cobalt catalyst and an ethanol precursor in a miniature hot walled reactor with optical *** spectra at room temperature and at the growth temperature are compared for two growth *** evolution of the G-band,D-band,and radial breathing mode(RBM)is tracked at the growth temperature with time resolution of a few *** are three identifiable phases in the evolution of the Raman signal intensity:an initial exponential increasing phase,a linear growth phase,and a saturation *** situ optical spectroscopy thus enables the study of nucleation,steady growth,and deactivation processes to be investigated separately in real *** evolution curves for all bands(G,D,and RBM),when scaled,collapse onto the same curve,to within experimental uncertainty.

关键词： Single-walled carbon nanotube chemical vapor deposition Raman spectroscopy nucleation termination

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Raman microscopy mapping for the purity assessment of chirality enriched carbon nanotube networks in thin- film transistors

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Nano Research 2015年第7期8卷 2179-2187页

作者： Zhao Li Jianfu Ding paul finnie jacques lefebvre Fuyong Cheng ChristopherT. Kingston Patrick R. L. Malenfant Security and Disruptive Technologies Portfolio National Research Council Canada 1200 Montreal Road Ottawa Ontario K1A OR6 Canada

With recent improvements in carbon nanotube separation methods, the accurate determination of residual metallic carbon nanotubes in a purified nanotube sample is important, particularly for those interested in using semiconducting single-walled carbon nanotubes （SWCNTs） in electronic device applications such as thin-film transistors （TFTs）. This work demonstrates that Raman microscopy mapping is a powerful characterization tool for quantifying residual metallic carbon nanotubes present in highly enriched semiconducting nanotube networks. Raman mapping correlates well with absorption spectroscopy, yet it provides greater differentiation in purity. Electrical data from TFTs with channel lengths of 2.5 and 5μ m demonstrate the utility of the method. By comparing samples with nominal purities of 99.0% and 99.8%, a clear differentiation can be made when evaluating the current on/off ratio as a function of channel length, and thus the Raman mapping method provides a means to guide device fabrication by correlating SWCNT network density and purity with TFT channel scaling.

关键词： raman spectroscopy carbon nanotubes thin film transistors microscopy mapping purity assessment

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