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Microstructure and magnetic properties of Ti/Co/Ti films

Rare Metals 2006年第z1期25卷 450-453页

作者： feng shunzhen zhang yujie zhang hanwei sun huiyuan College of Physics Science and Information Engineering Hebei Normal University Shijiazhuang 050016 China College of Physics Science and Information Engineering Hebei Normal University Shijiazhuang 050016 China College of Physics Science and Information Engineering Hebei Normal University Shijiazhuang 050016 China College of Physics Science and Information Engineering Hebei Normal University Shijiazhuang 050016 China

The two series of as-deposited and annealed Ti/Co/Ti thin films were deposited by magnetron sputtering onto glass substrates at room temperature. The structural and magnetic properties of the films at room temperature were investigated as function of Co layer thickness. X-ray diffraction (XRD) profiles show Co nanograins are formed as the hexagonal-close-packed (hcp) structure. The perpendicular coercivity of the Ti(15 nm)/Co(30 nm)/Ti(15 nm) film annealed at 450 ℃ for 30 min is about 288 kA·m-1.

关键词： perpendicular magnetic recording coercivity Ti/Co/Ti thin films

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Microstructure and magnetic properties of Ti/Ni/Ti in dependence on Ni layer thickness

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Rare Metals 2006年第z1期25卷 592-595页

作者： zhang hanwei feng shunzhen zhang yujie sun huiyuan College of Physics Science and Information Engineering Hebei Normal University Shijiazhuang 050016 China College of Physics Science and Information Engineering Hebei Normal University Shijiazhuang 050016 China College of Physics Science and Information Engineering Hebei Normal University Shijiazhuang 050016 China College of Physics Science and Information Engineering Hebei Normal University Shijiazhuang 050016 China

The films of Ti(15 nm)/Ni(t nm)/Ti(15 nm)(t=20, 30, 40, 50) were prepared by dc magnetron sputtering at room temperature and subsequent annealing at 400 ℃ for 30 min. Scanning probe microscope (SPM), vibrating sample magnetometer (VSM) and X-ray diffraction (XRD) were applied to study the magnetic properties and microstructure. AFM images show that small and uniform grains and some clusters appear with the increase of Ni thickness, also MFM images show that the size of domain first decreases and then increases. The coercivity reaches the maximum 48 kA·m-1 at t=30 nm. The XRD profiles show stronger fcc (111) orientation peak of Ni and weak hcp structure peaks of Ni3Ti. This results reveal that the crystal lines have the prefer orientation and achieve the ordered.

关键词： magnetic recording magnetron sputtering coercivity annealing

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维普期刊数据库

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Effect of Ti layer thickness on microstructure and magnetic properties of Ti/Co/Ti films

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Rare Metals 2006年第z1期25卷 609-612页

作者： zhang yujie zhang hanwei feng shunzhen sun huiyuan HU Yanying PENG Yan College of Physics Science and Information Engineering Hebei Normal University Shijiazhuang 050016 China College of Physics Science and Information Engineering Hebei Normal University Shijiazhuang 050016 China College of Physics Science and Information Engineering Hebei Normal University Shijiazhuang 050016 China College of Physics Science and Information Engineering Hebei Normal University Shijiazhuang 050016 China College of Physics Science and Information Engineering Hebei Normal University Shijiazhuang 050016 China College of Physics Science and Information Engineering Hebei Normal University Shijiazhuang 050016 China

TiCoTi granular films were prepared by DC facing-target magnetron sputtering system onto glass substrates and subsequently in situ annealing in vacuum. Structural of Ti (t nm)/Co (40 nm)/Ti (t nm) films were investigated in detail, which shows that the majority Co nanograins are formed as the hexagonal-close-packed (HCP) structure. Vibrating sample magnetometer (VSM) and scanning probe microscope (SPM) were applied to study the magnetic properties, morphologies and domain structures of these samples. It has been found that the structure and magnetic properties of the Ti/Co/Ti films depend strongly on the Ti layer thickness. The out-of-plane coercivities (Hc) of the film is maximum about 78.8 kA·m-1 when t=5 nm with annealing at 300 ℃; the distributing of grains of the sample is uniformity; and the average size of particles is about 13 nm. The obtained results suggest that this system is perpendicular anisotropy and might be applicable to perpendicular magnetic recording media.

关键词： facing-target magnetron sputtering perpendicular magnetic recording HCP-structure coercivity

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