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3D reconstruction and defect pattern recognition of bonding wire based on stereo vision
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CAAI Transactions on Intelligence Technology 2024年 第2期9卷 348-364页
作者: Naigong Yu Hongzheng Li Qiao Xu Ouattara Sie essaf firdaous Faculty of Information Technology Beijing University of TechnologyBeijingChina Beijing Key Laboratory of Computing Intelligence and Intelligent System Beijing University of TechnologyBeijingChina Engineering Research Center of Digital Community Ministry of EducationBeijingChina College of Robotic UniversitéFélix Houphouët‐BoignyAbidjanCôte d’Ivoire
Non-destructive detection of wire bonding defects in integrated circuits(IC)is critical for ensuring product quality after ***-processing-based methods do not provide a detailed evaluation of the three-dimensional def... 详细信息
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