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Dose-efficient scanning Compton X-ray microscopy

Light(Science & Applications) 2023年第6期12卷 1141-1152页

作者： Tang Li JLukas Dresselhaus Nikolay Ivanov Mauro Prasciolu Holger Fleckenstein Oleksandr Yefanov Wenhui Zhang david pennicard Ann-Christin Dippel Olof Gutowski Pablo Villanueva-Perez Henry N.Chapman Saša Bajt The Hamburg Centre for Ultrafast Imaging 22761 HamburgGermany Center for Free-Electron Laser Science CFEL Deutsches ElektronenSynchrotron DESY22607 HamburgGermany Deutsches Elektronen Synchrotron DESY 22607 HamburgGermany Synchrotron Radiation Research and NanoLund Lund University22100 LundSweden Department of Physics Universität Hamburg22761 HamburgGermany

The highest resolution of images of soft matter and biological materials is ultimately limited by modification of the structure,induced by the necessarily high energy of short-wavelength *** the inelastically scattered X-rays at a photon energy of 60 keV(0.02 nm wavelength)offers greater signal per energy transferred to the sample than coherent-scattering techniques such as phase-contrast microscopy and projection *** present images of dried,unstained,and unfixed biological objects obtained by scanning Compton X-ray microscopy,at a resolution of about 70 *** microscope was realised using novel wedged multilayer Laue lenses that were fabricated to sub-ångström precision,a new wavefront measurement scheme for hard X rays,and efficient pixel-array *** doses required to form these images were as little as 0.02%of the tolerable dose and 0.05%of that needed for phase-contrast imaging at similar resolution using 17 keV photon *** images obtained provide a quantitative map of the projected mass density in the sample,as confirmed by imaging a silicon *** on these results,we find that it should be possible to obtain radiation damage-free images of biological samples at a resolution below 10 nm.

关键词： wedge dried scattered

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X-ray focusing with efficient high-NA multilayer Laue lenses

引用

Light(Science & Applications) 2017年第1期6卷 95-103页

作者： Saša Bajt Mauro Prasciolu Holger Fleckenstein Martin Domaracký Henry N Chapman Andrew J Morgan Oleksandr Yefanov Marc Messerschmidt Yang Du Kevin T Murray Valerio Mariani Manuela Kuhn Steven Aplin Kanupriya Pande Pablo Villanueva-Perez Karolina Stachnik Joe PJ Chen Andrzej Andrejczuk Alke Meents Anja Burkhardt david pennicard Xiaojing Huang Hanfei Yan Evgeny Nazaretski Yong S Chu Christian E Hamm Photon Science DESYNotkestrasse 85Hamburg 22607Germany Center for Free-Electron Laser Science DESYNotkestrasse 85Hamburg 22607Germany Department of Physics University of HamburgLuruper Chaussee 149Hamburg 22607Germany Centre for Ultrafast Imaging Luruper Chaussee 149Hamburg 22607Germany National Science Foundation BioXFEL Science and Technology Center 700 Ellicott StreetBuffaloNY 14203USA Department of Physics Arizona State UniversityTempeAZ 85287USA Faculty of Physics University of BialystokCiolkowskiego 1L Str.Bialystok 15-245Poland National Synchrotron Light Source II Brookhaven National LaboratoryUptonNY 11973USA Alfred-Wegener Institute Helmholtz Center for Polar and Marine ResearchBussestr.27Bremerhaven 27570Germany

Multilayer Laue lenses are volume diffraction elements for the efficient focusing of *** a new manufacturing technique that we introduced,it is possible to fabricate lenses of sufficiently high numerical aperture(NA)to achieve focal spot sizes below 10 *** alternating layers of the materials that form the lens must span a broad range of thicknesses on the nanometer scale to achieve the necessary range of X-ray deflection angles required to achieve a high *** poses a challenge to both the accuracy of the deposition process and the control of the materials properties,which often vary with layer *** introduced a new pair of materials—tungsten carbide and silicon carbide—to prepare layered structures with smooth and sharp interfaces and with no material phase transitions that hampered the manufacture of previous *** a pair of multilayer Laue lenses(MLLs)fabricated from this system,we achieved a two-dimensional focus of 8.4×6.8 nm2 at a photon energy of 16.3 keV with high diffraction efficiency and demonstrated scanning-based imaging of samples with a resolution well below 10 *** high NA also allowed projection holographic imaging with strong phase contrast over a large range of *** error analysis indicates the possibility of achieving 1 nm focusing.

关键词： multilayer Laue lenses multilayers ptychography X-ray holography X-ray optics

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