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Effect of Cobalt Doping on the microstructure and Tensile Properties of Lead Free Solder Joint Subjected to Electromigration

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Journal of materials Science & Technology 2016年第11期32卷 1129-1136页

作者： m.nasir Bashir A.S.m.A.Haseeb abu zayed m.ham.ad saliqur rahm.n m.A.Fazal Department of mechanical Engineering University of Malaya

Rapid Cu diffusion is one of the main causes of electromigration（Em） failure in lead-free solder *** this study, an effort has been made to investigate the detrimental effects of Em on microstructure and mechanical performance of solder joint by introducing Co nanoparticles（nP） doped flux at the interface between SAC305 solder and copper substrate. Em tests were conducted on un-doped SAC305 and Co-doped SAC305 solder joints for different time intervals, with the maximum duration of 1128 h. A DC current was applied to the both types of solder joints to achieve a current density of 1 × 104A/cm2. Em tests were performed in an oil bath maintained at a constant temperature of 80 °C. It is found that Codoped flux significantly reduced the formation of cracks and voids at the cathode interface. Co atoms entered into the lattice of Cu6Sn5 leading to the formation of（Cu, Co）6Sn5. This thermodynamically stabilized the interfacial intermetallic（ImC） layers both at the anode and cathode sides and suppressed the change in their thickness. The average anodic growth rate of（Cu, Co）6Sn5 interfacial ImC in the doped sample was about one order of magnitude lower compared with that of Cu6Sn5 in the un-doped ***-nP also improved the tensile strength considerably before and after Em. The report suggests that the reliability of solder joint during Em can be improved by using Co-nP doped flux.

关键词： Electromigration damages Tensile strength Intermetallic compounds nanoparticles Reliability

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Photoluminescence Properties of natural na2SO4 Activated with Rare Earth Ions

Photoluminescence Properties of Natural Na2SO4 Activated wit...

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作者： rahm.n abu zayed m.ham.ad saliqur Aierken Sidike T.Awata Q.Xu K.Atobe n.Yamashita Okayama University Xinjiang normal University naruto University of Education

InTRODUCTIOn:Thenardite(naSO) is a fluorescent mineral showing white luminescence under short-wave ultraviolet(UV) light(253.7 nm Hg line), milk-white luminescence under long-wave UV light (365.0 nm Hg line),and long *** contents of trace elements in natural thenardite from Ai-Ding Salt Lake at Turpan,Xinjiang,China,were determined using an inductively coupled plasma-mass spectrometry (ICP-mS) *** was found that the thenardite from Ai-Ding Salt Lake consists of extremely pure

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