Sharing one ICP source for simultaneous elemental analysis by ICP-MS/OES: some unique instrumental capabilities
作者单位：Analytical & Testing Center Sichuan University College of Chemistry Sichuan University
会议名称：《第三届全国质谱分析学术报告会》
会议日期：2017年
学科分类：081704[工学-应用化学] 07[理学] 08[工学] 0817[工学-化学工程与技术] 070302[理学-分析化学] 0703[理学-化学]
关 键 词：Inductively coupled plasma Mass spectrometry Optical emission spectrometry Simultaneous determination Trace elements
摘 要：Inductively coupled plasma（ICP） is one of the most popular sources in analytical atomic spectrometers, including inductively coupled plasma mass spectrometry（ICP-MS） and inductively coupled plasma optical emission spectrometry（ICP-OES）. There are several unique independent advantages for either of them. Therefore, a simultaneous elemental analysis system was established as shown in Figure 1. for synergetic work of ICP-MS and ICP-OES by sharing one ICP to improve the analytical figures of merit. To demonstrate its unique utility, several special applications were studied, including correction of interferences for each other, synergetic determination for accurate analysis and combinatorial analysis for larger inear ranges of calibration curves.