Study of Thin Film Morphologies by Grazing Incidence Small Angle X-ray Scattering（GISAXS）
作者单位：Technology Innovation CenterDaikin IndustriesLtd. Polymer Science and EngineeringUniversity of Massachusetts Advanced Photon SourceArgonne National Laboratory
会议名称：《2016年全国高分子材料科学与工程研讨会》
会议日期：2016年
学科分类：07[理学] 070205[理学-凝聚态物理] 08[工学] 080501[工学-材料物理与化学] 0805[工学-材料科学与工程（可授工学、理学学位）] 0702[理学-物理学]
摘 要：正Grazing incidence small angle x-ray scattering（GISAXS）experiments were performed on thin films of Nafion solutions as a function of temperature under humidity control,and as a function of humidity at constant *** development and orientation of the structure and morphology inthe thin films,at the free surtace and in the bulk of the film,was charactenzed by the scattering below and above the critical *** scattering profiles indicated that Nafion thin film morphology was strongly influenced by the