A Novel Configurable Boundary-scan Circuit Design of SRAM-Based FPGA
会议名称:《2011 IEEE International Conference on Computer Science and Automation Engineering(CSAE 2011)》
会议日期:2011年
学科分类:080902[工学-电路与系统] 0809[工学-电子科学与技术(可授工学、理学学位)] 08[工学]
关 键 词:Configurable Boundary-scan SRAM cell FPGA
摘 要:This paper presents a novel configurable boundaryscan circuit (CBSC) of SRAM-based field programmable gate array (FPGA).The embedded SRAM cells of FPGA have been used to modify the original structure of boundary-scan circuit (BSC).Users only need to change the data stored in the embedded SRAM cell during the configuration of the FPGA *** this way,the boundary-scan chain can be configured to any desired *** with the original structure of BSC,this circuit using 0.25μm CMOS process can be part of a standard digital cell library and has been used in the BQV series FPGAs of BMTI.