A Low-Overhead Method of Embedded Software Profiling
会议名称：《2009 ISECS International Colloquium on Computing, Communication, Control, and Management》
会议日期：2009年
学科分类：08[工学] 081201[工学-计算机系统结构] 0812[工学-计算机科学与技术（可授工学、理学学位）]
基 金：supported by the Guangdong-Hong Kong Technolo-gy Cooperation Funding Scheme No.2007A010101003 Guangdong-Ministry of Education Industry-Univer-sity Cooperation Funding Scheme No.2007B090200018
关 键 词：low-overhead embedded software profiling
摘 要：With the continuous development of embedded technology,embedded applications are becoming increasingly popular in daily lives,and respectively embedded software is in great demand. As a result,how to profile embedded software to guarantee its quality becomes a focus of attention. This paper focuses on this issue. It analyzes current methods of embedded software profiling and their defects,and then proposes a low-overhead and more accurate method. It also performs some strict experiments to prove that it is effective and much better than current methods.