3D Characterization of Crystallographic Orientation in Polycrystals via EBSD(invited paper)
作者单位：EDAX-TSL 392 E 12300 SSuite HDraperUT 84020 USA Max-Planck-Institute for Iron Research Max-Planck-Str.1D-40237 DüsseldorfGermany
会议名称：《第二届全国背散射电子衍射（EBSD）技术及其应用学术会议暨第六届全国材料科学与图像科技学术会议》
会议日期：2007年
学科分类：08[工学] 080203[工学-机械设计及理论] 0802[工学-机械工程]
摘 要：Automated Electron Backscatter Diffraction(EBSD)in the Scanning Electron Microscope(SEM) provides critical insight into the role of crystallographic orientation in the behavior of polycrystalline *** EBSD studies of polycrystalline microstructures have generally been performed on two-dimensional(2D)planar *** such information is valuable,various factors are