Software BIT Design and Testing for Embedded Software

作     者：Wang Yichen Project system engineering department Beihang University Beijing China Zhou Zhenzhen Project system engineering department Beihang University Beijing China 

会议名称：《The 8th International Conference on Reliability,Maintainability and Safety(ICRMS 2009)》

会议日期：2009年

学科分类：08[工学] 0835[工学-软件工程] 081202[工学-计算机软件与理论] 0812[工学-计算机科学与技术（可授工学、理学学位）] 

关 键 词：embedded software software testability software Build-In-Test fault injection software testing 

摘      要：正Build-in-test of software is designed in embedded system *** paper analyses the general architecture of the embedded system,introduces three types of BIT structure pattern,for each pattern,the arithmetic design is described in details with real *** paper presents a new s/w BIT approach based on fault *** important phrases: testing requirement analysis,fault injection,testing design and result analysis are described thoroughly in this *** ending part is the summery of the paper.