利于SR和FIB法制备含氟微米/纳米结构材料(英文)
作者单位:Research Institute for Science and Engineering(RISE)Waseda University3-4-1OkuboShinjukuTokyo169-8555JAPAN The Institute of Science and Industrial Research(ISIR)Osaka University8-1 MihogaokaIbarakiOsaka567-0047JAPAN Sumitomo Heavy IndustriesLtd.NishitokyoTokyo188-8585JAPAN
会议名称:《第九届中国辐射固化年会》
会议日期:2008年
学科分类:07[理学] 070205[理学-凝聚态物理] 08[工学] 080501[工学-材料物理与化学] 0805[工学-材料科学与工程(可授工学、理学学位)] 0702[理学-物理学]
摘 要:正Micro-and nano-fabrications of various perfluorinated polymers were carried out by synchrotron radiation(SR)direct photo-etching,and by focused ion beam(FIB)direct mask less *** the irradiation,the etching depth has been evaluated by optical microscope and scanning electron microscope of the fabricated ***,SR-induced surface modifications were studied by solid-state 19F ’nuclear magnetic resonance(NMR)spectroscopy and differential scanning