Development of a Reflection-Mode Scanning Near-Field THz-Wave Microscopy with Coherent Transition Radiation
作者单位：School of Physical SciencesThe Graduate University for Advanced Studies UVSOR FacilityInstitute for Molecular Science
会议日期：2010年
学科分类：07[理学] 08[工学] 070201[理学-理论物理] 0803[工学-光学工程] 0702[理学-物理学]
基 金：supported by Quantum Beam Technology Program of MEXT Japan
摘 要：INTRODUCTION:The technique of near-field THz-wave microscopy is a characteristic application of coherent radiation emitted from a relativistic electron *** technique provides high spatial resolution below the diffraction *** the previous report we obtained the spatial resolution power ofλ/4 in the transmission *** measurement is also important for the THz-wave *** the present report we has been experimentally investigated the