INFRARED OPTICAL PROPERTIES OF VANADIUM OXIDE THIN FILMS
作者单位：The University of Texas at Dallas Erik Jonsson School of Engineering and Computer Science Center for Applied Optics P.O. Box 830688 MP 31 Richardson TX 75083-0688 U.S.A.
会议名称：《International Conference on Millimeter Wave and far-Infrared Technology》
会议日期：1989年
学科分类：080901[工学-物理电子学] 0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学] 080401[工学-精密仪器及机械] 0804[工学-仪器科学与技术] 0803[工学-光学工程]
摘 要：正 Thin films of various vanadium oxides, including the phase transition materials vanadium dioxide and vanadium pentoxide, have been prepared by reactive ion-beam sputtering. Results show that film microstructure is the dominant factor affecting the optical properties of these coatings. Changes in optical reflectance and transmittance data, which accompany the structural changes, are presented and discussed.