Possible abnormal mechanism for lattice strain relaxation in La0.7Ca0.3MnO3 thin film

作     者：W.S.Tan H.L.Cai X.S.Wu S.S.Jiang Q.J.Jia J.GaoDepartment of Applied Physics Nanjing University of Science and Technology Nanjing210094 P.R.China National Laboratory of Solid State Microstructures Department of Physics NanjingUniversity Nanjing 210093 P.R.China Institute of High Energy Physics Chinese Academy of Science Beijing 100039 P.R.China Department of Physics HongKong University HongKong PR.China 

会议名称：《Ⅻ International Symposium on Small Particles and Inorganic Clusters》

会议日期：2004年

学科分类：081704[工学-应用化学] 07[理学] 08[工学] 0817[工学-化学工程与技术] 0703[理学-化学] 070301[理学-无机化学] 

关 键 词：La0.7Ca0.3MnO3 film Grazing incidence X-ray diffraction Strain relaxation In-plane lattice parameter 

摘      要：正 By the method of 90°off-axis radio frequency magnetron sputtering, La0.7Ca0.3MnO3 （LCMO） thin films with the thickness of 500 A were deposited on （001）-oriented single crystal substrates including SrTi03（STO）, MgO and sapphire（α-Al2O3, ALO）. Normal X-ray diffraction indicated high crystal qualities and well c-axis-orientation of samples LCMO/STO and LCMO/MgO, whereas LCMO/ALO film was polycrystalline. Grazing incidence X-ray