NEW APPROACH TO EMULATE SEU FAULTS ON SRAM BASED FPGAS

作     者：Reza Omidi Gosheblagh Karim Mohammadi 

作者机构：Department of Electrical Engineering Iran University of Science and Technology (IUST) 

出 版 物：《Journal of Electronics(China)》 (电子科学学刊（英文版）)

年 卷 期：2014年第31卷第1期

页      面：68-77页

学科分类：080903[工学-微电子学与固体电子学] 0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学] 

主　　题：Field Programmable Gate Arrays(FPGAs) Single-Event Upset(SEU) fault injection Soft-core Space radiation effects 

摘      要：Field Programmable Gate Arrays(FPGAs)offer high capability in implementing of complex systems,and currently are an attractive solution for space system ***,FPGAs are susceptible to radiation induced Single-Event Upsets(SEUs).To insure reliable operation of FPGA based systems in a harsh radiation environment,various SEU mitigation techniques have been *** this paper we propose a system based on dynamic partial reconfiguration capability of the modern devices to evaluate the SEU fault effect in *** proposed approach combines the fault injection controller with the host FPGA,and therefore the hardware complexity is *** of the SEU injection and evaluation requirements are performed by a soft-core which realized inside the host *** results on some standard benchmark circuits reveal that the proposed system is able to speed up the fault injection campaign 50 times in compared to conventional method.