The development and application of the test system for the silicon pixel modules in HEPS-BPIX
作者机构：State Key Laboratory of Particle Detection and ElectronicsInstitute of High Energy PhysicsChinese Academy of Sciences(CAS)Beijing 100049China Institute of High Energy PhysicsChinese Academy of Sciences19 B Yuquan RdShijingshan DistrictBeijingChina University of Chinese Academy of Sciences(UCAS)Beijing 100049China
出 版 物：《Radiation Detection Technology and Methods》 (辐射探测技术与方法（英文）)
年 卷 期：2021年第5卷第1期
页 面：53-60页
核心收录：
学科分类：07[理学] 070202[理学-粒子物理与原子核物理] 0702[理学-物理学]
基 金：the State Key Laboratoryof Particle Detection and Electronics SKLPDE-ZZ-202002
主 题：Hybrid silicon pixel module Test and calibration Power management Through silicon via and wire-bonding HEPS
摘 要：Background HEPS-BPIX is a prototype of photon counting pixel detector developed for the High Energy Photon *** consists of 16 silicon pixel modules which should be tested individually to ensure the function and *** Due to various factors such as the non-uniformity of the processes and voltage drop,the response of each pixel in the silicon pixel module is not identical *** response difference of pixels can be minimized by the threshold *** system is developed for the quality test and calibration of the silicon pixel *** The system consists of a mother board,a control board and a data acquisition(DAQ)*** mother board provides necessary resources including power supplies and the fanout of calibration ***,it can be used to test the connectivity by monitoring the power *** control board reads data out and provides the clock,trigger and configuration data for the silicon pixel *** DAQ system sends the control commands and receives the readout data through an Ethernet *** Compared with the previous readout system,this designed system has a lower noise level and better scanning curves making the calibration more *** it has been successfully applied to the comparison experiments of the through silicon via and wire-bonding silicon pixel *** The results show that this test system can be used to the quality test and calibration of the silicon pixel *** addition,the system can be adapted to the measurement of different pixel array detector modules.
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