Soft landing of runaway currents by ohmic field in J-TEXT tokamak
Soft landing of runaway currents by ohmic field in J-TEXT tokamak作者机构:International Joint Research Laboratory of Magnetic Confinement Fusion and Plasma PhysicsState Key Laboratory of Advanced Electromagnetic Engineering and TechnologySchool of Electrical and Electronic EngineeringHuazhong University of Science and Tech no logyWuhan 430074People's Republic of China Southwestern Institute of PhysicsChengdu 610041.People's Republic of China Chengdu UniversityChengdu 610106People's Republic of China Beibu Gulf UniversityQinzhou 535000People's Republic of China
出 版 物:《Plasma Science and Technology》 (等离子体科学和技术(英文版))
年 卷 期:2020年第22卷第11期
页 面:11-22页
核心收录:
学科分类:08[工学] 082701[工学-核能科学与工程] 0827[工学-核科学与技术]
基 金:supported by the National Key R&D Program of China(No.2017YFE0302000) the National Magnetic Confinement Fusion Science Program of China(Nos.2015GB111002,2015GB104000) National Natural Science Foundation of China(Nos.11775089,51821005,71762031,11575068,11905077) the China Postdoctoral Science Foundation(2019M652615)
主 题:tokamak disruption runaway electron hard x-ray
摘 要:Recently,experimental studies on the soft landing of RE current by ohmic(OH)field have been performed in J-TEXT tokamak,as a possible auxiliary method to dissipate the RE *** optimized horizontal displacement control of the RE beam,the toroidal electric field has been scanned from 1.6 to—0.3 V m^-1 during the RE plateau *** growth rate of RE currents and the evolution of hard x-ray(HXR)emissions have been *** is found that when the toroidal electric field is less than 7-12 times the theoretical critical electric field,the decay of REs could be *** dissipation rate by the ohmic field can reach a maximum value of 3 MA s^-***,the results of HXR spectra analysis indicate the different behaviors of HXR emissions under the condition of different toroidal electric *** analysis of the ionized argon emissions and magnetic fluctuations shows that under the condition of different toroidal electric fields,the physical process of RE generation may be different.