The beam-based calibration of an X-ray pinhole camera at SSRF
The beam-based calibration of an X-ray pinhole camera at SSRF作者机构:Shanghai Synchrotron Radiation Facility Shanghai Institute of Applied Physics
出 版 物:《Chinese Physics C》 (中国物理C(英文版))
年 卷 期:2012年第36卷第1期
页 面:80-83页
核心收录:
学科分类:070207[理学-光学] 07[理学] 08[工学] 070202[理学-粒子物理与原子核物理] 0803[工学-光学工程] 0702[理学-物理学]
基 金:Supported by NSFC (11075198)
主 题:beam diagnostics X-ray pinhole camera point spread function beam size measurement
摘 要:A pinhole camera for imaging X-ray synchrotron radiation from a dipole magnet is now in operation at the Shanghai Synchrotron Radiation Facility (SSRF) storage *** electron beam size is derived by unfolding the radiation image and the point spread function (PSF) with deconvolution *** performance of the pinhole is determined by the accuracy of the PSF *** article will focus on a beam-based calibration scheme to measure the PSF system by varying the beam images with different quadrupole settings and fitting them with the corresponding theoretical beam *** this method at SSRF,the PSF value of the pinhole is revised from 37 to 44μ*** deviation in beam size between the theoretical value and the measured value isminimized to 4% after *** optimization allows us to observe the horizontal disturbance due to injection down to as small as 0.5μm.