Tolerance analysis of non-depolarizing double-pass polarimetry
作者机构：Shanghai Micro Electronics Equipment(Group)Co.Ltd.1525 Zhangdong Road201203 ShanghaiChina.2StamfordConnecticutUSA.
出 版 物：《PhotoniX》 (智汇光学（英文）)
年 卷 期：2020年第1卷第1期
页 面：75-94页
核心收录：
学科分类：07[理学] 0701[理学-数学] 070101[理学-基础数学]
基 金：The authors are thankful to Zejiang Meng for introducing the ECM algorithm Vladimir Nikishkin for coding assistance and Wei Wang for the initial contact with vendors for the specifications of the components used in the modeling as well as his exuberant personality. Last but not the least we acknowledge an extended vacation due to COVID-19 outbreak
主 题：Tolerance analysis Polarimetry Jones matrix Mueller matrix
摘 要：Double-pass polarimetry measures the polarization properties of a sample over a rangeof polar angles and all azimuths. Here, we present a tolerance analysis of all the opticalelements in both the calibration and measurement procedures to predict thesensitivities of the double-pass polarimeter. The calibration procedure is described by aMueller matrix based on the eigenvalue calibration method (ECM) [1]. Our numericalresults from the calibration and measurement in the Mueller matrix description withtolerances limited by systematic and stochastic noise from specifications ofcommercially available hardware components are in good agreement with previousexperimental observations. Furthermore, by using the orientation Zernike polynomials(OZP) which are an extension of the Jones matrix formalism, similar to the Zernikepolynomials wavefront expansion, the pupil distribution of the polarization propertiesof non-depolarizing samples under test are expanded. Using polar angles ranging upto 25°, we predict a sensitivity of 0.5% for diattenuation and 0.3° for retardance usingthe root mean square (RMS) of the corresponding OZP coefficients as a measure of theerror. This numerical tool provides an approach for further improving the sensitivities ofpolarimeters via error budgeting and replacing sensitive components with thosehaving better precision.
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