INVESTIGATION OF BONDING IN NANO-SiO_(2) BY Si L_(2,3) X-RAY ABSORPTION NEAR-EDGE STRUCTURE SPECTROSCOPY
INVESTIGATION OF BONDING IN NANO-SiO_2 BY Si L_(2,3) X-RAY ABSORPTION NEAR-EDGE STRUCTURE SPECTROSCOPY作者机构:Inst. of High Energy Phys. Chinese Acad. of Sci. Beijing 100039 China
出 版 物:《Acta Metallurgica Sinica(English Letters)》 (金属学报(英文版))
年 卷 期:2001年第14卷第6期
页 面:473-478页
核心收录:
学科分类:081704[工学-应用化学] 07[理学] 08[工学] 0817[工学-化学工程与技术] 070302[理学-分析化学] 0703[理学-化学]
基 金:supported by 100-Tatlent Research Program of The Chinese Academy of Sciences the Natinal Natural Science Foundation of China(NSFC)for financial support(Grant No.10074063) The Chinese Academy of Sciences(No.KJ952-S1-418)
主 题:multiple scattering calculation X-ray absorption nano particle electronic structure
摘 要:The Si L2,3 X-ray absorption near-edge structure (XANES) can be used to probe thelocal structure around Si and derive electronic information of the unoccupied s- andd-like partial density of states in nano-size SiO2. We present Si L2,3-edge for threedifferent size silicates acquired by total electron yield (TEY) at the photoemission sta-tion of Beijing Synchrotron Radiation Facility (BSRF). The Si L2,3-edge spectra areinterpreted based on ab initio full multiple-scattering (MS) calculation. The Si L2.3-edge of nano-size materials has XANES similar to that of a-quartz. The similaritiesbetween the Si L2.3-edge shapes attest to a common molecular-orbital picture of theirSi-O bonding and the same coordination state. However, a considerable broadeningof Si L2,3-edge XANES spectra as decrease of particle size is also an indicative ofpolyhedral distortions.