Near-Field Optical Identification of Metallic and Semiconducting Single-Walled Carbon Nanotubes

作     者：Lele Wang Bosai Lyu Qiang Gao Jiajun Chen Zhe Ying Aolin Deng Zhiwen Shi 王乐乐;吕博赛;高强;陈佳俊;应哲;邓奥林;史志文

作者机构：Key Laboratory of Artificial Structures and Quantum Control(Ministry of Education)Shenyang National Laboratory for Materials ScienceSchool of Physics and AstronomyShanghai Jiao Tong UniversityShanghai 200240 Collaborative Innovation Center of Advanced MicrostructuresNanjing 210093 

出 版 物：《Chinese Physics Letters》 (中国物理快报（英文版）)

年 卷 期：2020年第37卷第2期

页      面：70-73页

核心收录：

学科分类：081704[工学-应用化学] 07[理学] 070205[理学-凝聚态物理] 08[工学] 0817[工学-化学工程与技术] 080501[工学-材料物理与化学] 0805[工学-材料科学与工程（可授工学、理学学位）] 0703[理学-化学] 070301[理学-无机化学] 0702[理学-物理学] 

基　　金：the National Natural Science Foundation of China under Grant Nos.11574204 and 11774224 the National Key Research and Development Program of China(2016YFA0302001) Program for Professor of Special Appointment(Eastern Scholar)at Shanghai Institutions of Higher Learning additional support from a Shanghai talent program 

主　　题：method separating transparent 

摘      要：Single-walled carbon nanotubes(SWCNTs),due to their outstanding electrical and optical properties,are expected to have extensive applications,such as in transparent conductive fims and ultra-small field-effect transistors(FETs).However,those applications can only be best realized with pure metallic or pure semiconducting ***,identifying and separating metallic from semiconducting SWCNTs in as-grown samples are *** addition,knowledge of the type of an SWCNT is also important for further exploring its new properties in fundamental *** we report employing scanning near-field optical microscopy(SNOM)as a direct and simple method to identify metallic and semiconducting SWCNTs on SiO2/Si *** and semiconducting SWCNTs show distinct near-field optical responses because the metallic tubes support plasmons whereas the semiconducting tubes do *** reliability of this method is verified using FET testing and Rayleigh scattering *** result demonstrates that the SNOM technique provides a reliable,simple,noninvasive and in situ method to distinguish between metallic and semiconducting SWCNTs.