Rietveld quantification of γ-C_2S conversion rate supported by synchrotron X-ray diffraction images

作     者：Pi-qi ZHAO Xian-ping LIU Jian-guo WU Pei-ming WANG 

作者机构：School of Materials Science and Engineering Tongji University Key Laboratory of Advanced Civil Engineering Materials (Tongji University) Ministry of Education 

出 版 物：《Journal of Zhejiang University-Science A(Applied Physics & Engineering)》 (浙江大学学报（英文版）A辑（应用物理与工程）)

年 卷 期：2013年第14卷第11期

页      面：815-821页

核心收录：

学科分类：07[理学] 070205[理学-凝聚态物理] 08[工学] 080501[工学-材料物理与化学] 0805[工学-材料科学与工程（可授工学、理学学位）] 0702[理学-物理学] 

基　　金：Project supported by the National Natural Science Foundation of China(No.51102181) the National Basic Research Program (973) of China(No.2009CB623104) the Open Fund of Large Apparatus of Tongji University(Nos.0002012004 and 0002012012),China 

主　　题：β-C28 γ-C28 Rietveld quantification Synchrotron X-ray diffraction image 

摘      要：The pure γ-Ca2SiO4 （]t-C2S） phase was prepared at 1623 K of calcining temperature, 10 h of holding time and furnace cooling. The 13-C2S phase was obtained through γ-C2S conversion with the following calcination system which was adopted at 1473 K of calcining temperature, 1 h of holding time and then water-cooling. The conversion rate of γ-C2S was studied by the Rietveld quantitative laboratory X-ray powder diffraction supported by synchrotron X-ray diffraction images. The refinement results show that the final conversion rate of γ-C2S is higher than 92%. The absolute error of the γ-C2S conversion rate between two Rietveld refinements （sample with or without α-Al2O3） is 3.6%, which shows that the Rietveld quantitative X-ray diffraction analysis is an appropriate and accurate method to quantify the γ-C2S conversion rate.