A novel method to obtain electronic speckle pattern interferometry fringe patterns with high contrast

作     者：李孟委 唐晨 王高 任宏伟 唐科 叶天宇 

作者机构：Key Laboratory of Instrumentation Science & Dynamic MeasurementMinistry of EducationNorth University of China Department of Applied PhysicsTianjin University 

出 版 物：《Chinese Optics Letters》 (中国光学快报（英文版）)

年 卷 期：2009年第7卷第9期

页      面：788-790页

核心收录：

学科分类：070207[理学-光学] 07[理学] 08[工学] 0803[工学-光学工程] 0702[理学-物理学] 

基　　金：supported by the National Natural Science Foundation of China under Grant No.60877001 

主　　题：Interferometers Interferometry 

摘      要：Traditional speckle fringe patterns of electronic speckle pattern interferometry （ESPI） are obtained by adding, subtracting, or multiplying the speckle patterns recorded before and after the deformation. However, these speckle fringe patterns are of limited visibility, especially for addition and multiplication fringe patterns. We propose a novel method to obtain speckle fringe patterns of ESPI from undeformed and deformed speckle patterns. The fringe pattern generated by our method is of high contrast and has better quality than subtraction fringe. The new method is simple and does not require more computational effort. The proposed method is tested on the experimentally obtained undeformed and deformed speckle patterns. The experimental results illustrate the performance of this approach.