Weak measurement of the magneto-optical spin Hall effect of light

作     者：JIE LI TINGTING TANG LI LUO JIAN SHEN CHAOYANG LI JUN QIN LEI BI 

作者机构：Information Materials and Device Applications Key Laboratory of Sichuan Provincial UniversitiesChengdu University of Information TechnologyChengdu610225China State Key Laboratory of Marine Resource Utilization in South China SeaHainan UniversityHaikou570228China National Engineering Research Center of Electromagnetic Radiation Control MaterialsUniversity of Electronic Science and Technology of ChinaChengdu610054China 

出 版 物：《Photonics Research》 (光子学研究（英文版）)

年 卷 期：2019年第7卷第9期

页      面：1014-1018页

核心收录：

学科分类：0808[工学-电气工程] 0809[工学-电子科学与技术（可授工学、理学学位）] 07[理学] 0805[工学-材料科学与工程（可授工学、理学学位）] 070202[理学-粒子物理与原子核物理] 0702[理学-物理学] 

基　　金：Sichuan Science and Technology Program(2019JDJQ0003) Open Project Program of State Key Laboratory of Marine Resource Utilization in South China Sea(2019010) National Natural Science Foundation of China(NSFC)(61505016,61751103,51522204) 

主　　题：Weak measurement of the magneto-optical spin Hall effect of light 

摘      要：The spin Hall effect of light(SHEL) is a photonic version of the spin Hall effect in electronic systems and has been studied for more than 10 years. However, the lack of effective methods for dynamic modulation of spin-dependent splitting may hinder its applications. By introducing additional spin-orbit coupling of photons or nonreciprocal phase shift(NRPS), the magneto-optical Kerr effect may be one of the methods to alleviate the situation. Here, we experimentally reveal an enhanced and tunable SHEL in magneto-optical oxide thin films under the transverse magneto-optical Kerr effect configuration for the first time, to the best of our knowledge, which can be regarded as the magneto-optical SHEL(MOSHEL). We study the magneto-optical response of the multilayer structure and select the optimal structural parameters by the magneto-optical transfer matrix method. With a transverse magnetic field along opposite directions, an obvious SHEL shift difference of H-polarized light caused by NRPS is observed via a weak measurement method. With optimal parameters, the maximum measured shift difference of the SHEL achieves about 70 μm. The demonstrated MOSHEL phenomenon may accelerate the application of the SHEL in the field of spin photonics devices and precision metrology.