Examination of the wavelet-based approach for measuring self-similarity of epileptic electroencephalogram data

作     者：Suparerk JANJARASJITT 

作者机构：Department of Electrical and Electronic Engineering Ubon Ratchathani University 

出 版 物：《Journal of Zhejiang University-Science C(Computers and Electronics)》 (浙江大学学报C辑（计算机与电子（英文版）)

年 卷 期：2014年第15卷第12期

页      面：1147-1153页

核心收录：

学科分类：0831[工学-生物医学工程（可授工学、理学、医学学位）] 0711[理学-系统科学] 07[理学] 08[工学] 080401[工学-精密仪器及机械] 0804[工学-仪器科学与技术] 080402[工学-测试计量技术及仪器] 0836[工学-生物工程] 

主　　题：Self-similarity Power-law behavior Wavelet analysis Electroencephalogram Eoilensv Seizure 

摘      要：Self-similarity or scale-invariance is a fascinating characteristic found in various signals including electroencephalogram （EEG） signals. A common measure used for characterizing self-similarity or scale-invariance is the spectral exponent. In this study, a computational method for estimating the spectral exponent based on wavelet transform was examined. A series of Daubeehies wavelet bases with various numbers of vanishing moments were applied to analyze tile self-similar characteristics of intracranial EEG data corresponding to different pathological states of the brain, i.e., ictal and interictal states, in patients with epilepsy. The computational results show that the spectral exponents of intracranial EEG signals obtained during epileptic seizure activity tend to be higher than those obtained during non-seizure periods. This suggests that the intracranial EEG signals obtained during epileptic seizure activity tend to be more self-similar than those obtained during non-seizure periods. The computational results obtained using the wavelet-based approach were validated by comparison with results obtained using the power spectrum method.