Characterizing Fracture Spatial Patterns by Using Semivariograms

作     者：许建东 LIN Chiente R.D.JACOBI 

作者机构：Institute of Geology China Seismological Bureau Beijing 100029 China KAO YUAN Institute of Technology Kaohsiung Taiwan China Department of Geology 876 NSM Complex State University of New York at Buffalo NY 14260 USA 

出 版 物：《Acta Geologica Sinica(English Edition)》 (地质学报（英文版）)

年 卷 期：2002年第76卷第1期

页      面：89-99页

核心收录：

学科分类：0709[理学-地质学] 081803[工学-地质工程] 07[理学] 08[工学] 0708[理学-地球物理学] 0818[工学-地质资源与地质工程] 

基　　金：Financial support from the Rock Fracture Project at the State University of New York Many thanks are due to anonymous reviewers and editors for their constructive and editorial corrections 

主　　题：fracture pattern semivariogram fracture spacing fracture length 

摘      要：Semivariogram is applied to fracture data obtained from detailed scanlinesurveys of nine field sites in western New York, USA in order to investigate the spatial patterns ofnatural fractures. The length of the scanline is up to 36 m. How both fracture spacing and fracturelength vary with distance is determined through semivariogram calculations. In this study, theauthors developed a FORTRAN program to resample the fracture data from the scanline survey. Bycalculating experimental semivariogram, the authors found five different types of spatial patternsthat can be described by linear, spherical, reversed spherical, polynomial I (for aO) models, of which the last three arc newly proposed in this study. Thewell-structured semivariograms of fracture spacing and length indicate that both the location of thefractures and the length distribution within their structure domains are not random. The results ofthis study also suggest that semivariograms can provide useful information in terms of spatialcorrelation distance for fracture location and fracture length. These semivariograms can also beutilized to design more efficient sampling schemes for further surveys. as well as to define thelimits of highly probable extrapolation of a structure domain.