Advances in Microscale Laser Shock Peening

作     者：KYSAR Jeffrey W. YAO Y.Lawrence 

作者机构：Department of Mechanical Engineering Columbia University New York 10027 USADepartment of Mechanical Engineering Columbia University New York 10027 USA 

出 版 物：《Tsinghua Science and Technology》 (清华大学学报（自然科学版（英文版）)

年 卷 期：2004年第9卷第5期

页      面：506-518页

核心收录：

学科分类：08[工学] 0802[工学-机械工程] 080201[工学-机械制造及其自动化] 

基　　金：Supported by the National Science Foundation of USA (No. DMI-02-00334) and the National Science Foundation of USA under the Faculty Early Career Development (CAREER) Program (No. CMS-0134226) 

主　　题：laser shock peening X-ray micro-diffraction single crystal 

摘      要：The response of materials after microscale laser shock peening (μLSP) was experimentally characterized and compared with the theoretical prediction from the finite element method (FEM) analysis in microlength level. X-ray micro-diffraction technique was applied to the post-peened single crystal aluminum of (001) and (110) orientations, and X-ray profile was analyzed by sub-profiling and Fourier analysis method. Spatially resolved residual stress and strain deviation was quantified and explained in terms of the hetero- geneous dislocation cell structure. In-plane crystal lattice rotation induced by μLSP was measured by elec- tron backscatter diffraction (EBSD) and compared with the FEM simulation. Average mosaic size was evaluated from X-ray profile Fourier analysis and compared with the result from EBSD. Surface strength in- crease and dislocation cell structure formation were studied. The systematical characterization will lay the ground work for better understanding the effect of μLSP in microlength level and developing more realistic simulations.