Multiscale Product for Edge Detection

作     者：Nadia Ben Youssef Aicha Bouzid Noureddine Ellouze 

作者机构：the SignalImageand Information Technology LaboratoryDepartment of Electrical EngineeringNational Engineering School of Tunis Department of Electrical EngineeringNational Engineering School of Tunis 

出 版 物：《Journal of Electronic Science and Technology》 (电子科技学刊（英文版）)

年 卷 期：2014年第12卷第1期

页      面：112-115页

学科分类：07[理学] 08[工学] 080203[工学-机械设计及理论] 0802[工学-机械工程] 0701[理学-数学] 070101[理学-基础数学] 

基　　金：supported by the University of Tunis El Manar and National Engineering School of Tunis 

主　　题：Edge detection multiscale product,wavelet transform. : 

摘      要：Many methods have been proposed to extract the most relevant areas of an image. This article explores the method of edge detection by the multiscale product （MP） of the wavelet transform. The wavelet used in this work is the first derivative of a bidimensional Gaussian function. InitiaRy, we construct the wavelet, then we present the MP approach which is applied to binary and grey levels images. This method is compared with other methods without noise and in the presence of noise. The experiment results show fhht the MP method for edge detection outPerforms conventional methods even in noisy environments.