Observation of fractal patterns on superconducting Bi_2Sr_2Ca_1Cu_2O_(7-x) films on silicon by AFM

作     者：QIAN Wensheng, LIU Rong and WEI TongIiMicroelectronics Center, Southeast University, Nanjing 210096, China 

作者机构：Microelectronics Center Southeast University Nanjing China 

出 版 物：《Chinese Science Bulletin》 (中国科学通报)

年 卷 期：1997年第42卷第6期

页      面：526-528页

核心收录：

学科分类：08[工学] 080501[工学-材料物理与化学] 0805[工学-材料科学与工程（可授工学、理学学位）] 

主　　题：fractal BSCCO films. 

摘      要：SUPERCONDUCTING Bi2Sr2Ca1CU2O7-x（BSCCO） films have been prepared in-situ on Si substrates with yttria stabilized zirconia （YSZ） buffer layers by rf magnetron sputtering. The superconducting BSCCO films have a critical temperature （Tc） of 82 K. Atomic force microscope （AFM） and transmission electron microscope （TEM） were used to image the surface morphology and microstructure of superconducting BSCCO films. Fractal patterns were