A CMOS high resolution, process/temperature variation tolerant RSSI for WIA-PA transceiver

作     者：杨涛 姜宇 李杰 郭江飞 陈华 韩荆宇 郭桂良 阎跃鹏 

作者机构：Institute of Microelectronics Chinese Academy of Sciences 

出 版 物：《Journal of Semiconductors》 (半导体学报（英文版）)

年 卷 期：2015年第36卷第8期

页      面：141-149页

核心收录：

学科分类：0810[工学-信息与通信工程] 08[工学] 081001[工学-通信与信息系统] 

基　　金：supported by the National High Technology Research and Development Program of China(No.2011AA040102) 

主　　题：limiter RSSI high resolution dynamic range detection sensitivity rail-to-rail buffer 

摘      要：This paper presents a high resolution, process/temperature variation tolerant received signal strength indicator （RSSI） for wireless networks for industrial automation process automation （WIA-PA） transceiver fabri- cated in 0.18μm CMOS technology. The active area of the RSSI is 0.24 mm2. Measurement results show that the proposed RSSI has a dynamic range more than 70 dB and the linearity error is within ±0.5 dB for an input power from -70 to 0 dBm （dBm to 50 Ω）, the corresponding output voltage is from 0.81 to 1.657 V and the RSSI slope is 12.1 mV/dB while consuming all of 2 mA from a 1.8 V power supply. Furthermore, by the help of the integrated compensation circuit, the proposed RSSI shows the temperature error within ± 1.5 dB from -40 to 85 ℃, and process variation error within ±0.25 dB, which exhibits good temperature-independence and excellent robustness against process variation characteristics.