Spectroscopic ellipsometric study of the optical properties of Ag_2O film prepared by direct-current magnetron reactive sputtering

作     者：郜小勇 冯红亮 马姣民 张增院 

作者机构：The Key Laboratory of Material Physics of Ministry of EducationSchool of Physics and EngineeringZhengzhou University 

出 版 物：《Chinese Physics B》 (中国物理B（英文版）)

年 卷 期：2010年第19卷第9期

页      面：291-296页

核心收录：

学科分类：08[工学] 0805[工学-材料科学与工程（可授工学、理学学位）] 0704[理学-天文学] 0803[工学-光学工程] 

基　　金：supported by the National Natural Science Foundation of China (Grant No.60807001) Foundation of Henan Educational Committee (Grant No.2010A140017) 

主　　题：Ag2O film spectroscopic ellipsometry general oscillator model single-oscillator model 

摘      要：The Ag2O film, as-dcposited by direct-current magnetron reactive sputtering at a substrate temperature of 150 ℃, clearly shows a preferential orientation （111）, and is capable of lowering the threshold value of the thermal decomposition temperature to about 200℃, which is helpful to its application in optical and magneto-optical storage. This paper fits its optical constants in terms of a general oscillator model by using measured ellipsometric parameters. The fitted oscillator energy 2.487 eV is close to the optical direct interband transition energy value of the Ag2O film determined by Tauc equation; whereas, the fitted oscillator energy 4.249 eV is far from the fitted plasma oscillator energy 4.756 eV by single-oscillator energy. The photoluminescence spectrum centred at about 2.31 eV indicates a direct-energy gap photoluminescence mechanism of the Ag2O film.