Planning failure-censored constant-stress partially accelerated life test

作     者：Ali A.Ismail Abdulhakim A.Al-Babtain 

作者机构：Department of Statistics and Operations Research College of Science King Saud University Department of Statistics Faculty of Economics & Political Science Cairo University 

出 版 物：《Journal of Systems Engineering and Electronics》 (系统工程与电子技术（英文版）)

年 卷 期：2015年第26卷第3期

页      面：644-650页

核心收录：

学科分类：0808[工学-电气工程] 0809[工学-电子科学与技术（可授工学、理学学位）] 07[理学] 070104[理学-应用数学] 0802[工学-机械工程] 0811[工学-控制科学与工程] 0701[理学-数学] 0812[工学-计算机科学与技术（可授工学、理学学位）] 

基　　金：supported by the King Saud University Deanship of Scientific Research and College of Science Research Center 

主　　题：reliability confidence intervals coverage probabilities,optimum test plans Type-Ⅱ censoring Monte Carlo simulation. 

摘      要：This article deals with the case of the failure-censored constant-stress partially accelerated life test （CSPALT） for highly reliable materials or products assuming the Pareto distribution of the second kind. The maximum likelihood （ML） method is used to estimate the parameters of the CSPALT model. The performance of ML estimators is investigated via their mean square error. Also, the average confidence interval length （IL） and the associated co- verage probability （CP） are obtained. Moreover, optimum CSPALT plans that determine the optimal proportion of the test units al- located to each stress are developed. Such optimum test plans minimize the generalized asymptotic variance （GAV） of the ML estimators of the model parameters. For illustration, Monte Carlo simulation studies are given and a real life example is provided.