Ultrafast optoelectronic technology for radio metrology applications

作     者：Zhe Ma Hongmei Ma Pengwei Gong Chuntao Yang Keming Feng 

作者机构：Beijing Institute of Radio Metrology and Measurement Beijing 100854 R R. China National Key Lab of Metrology and Calibration Technology Beijing 100854 P. R. China 

出 版 物：《Journal of Systems Engineering and Electronics》 (系统工程与电子技术（英文版）)

年 卷 期：2010年第21卷第3期

页      面：461-468页

核心收录：

学科分类：080901[工学-物理电子学] 0809[工学-电子科学与技术（可授工学、理学学位）] 08[工学] 080401[工学-精密仪器及机械] 0804[工学-仪器科学与技术] 080402[工学-测试计量技术及仪器] 0803[工学-光学工程] 

主　　题：ultrafast optoelectronic technology terahertz pulse radio metrology electrooptic sampling(EOS). 

摘      要：Ultrafast optoelectronic technology has been widely used in terahertz time domain spectrum,terahertz imaging technology,terahertz communication and so on,and great progress has been achieved in the past two ***,this innovative technology has been applied in radio metrology and supplied a potential and hopeful method to solve the existent challenges of calibration devices and equipments with bandwidth up to 100 *** paper generally summarizes the emerging applications of the ultrafast optoelectronic technology in radio *** main applications of this technology in calibrating broadband sampling oscilloscopes,the high-speed photodiodes and calibrating the electrical pulse generators are emphasized,and the testing of monolithic microwave integrated circuits is also presented.