A NOVEL METHOD FOR MEASURING COMPLEX REFLECTION COEFFICIENT USING A FOUR-PORT REFLECTOMETER
A NOVEL METHOD FOR MEASURING COMPLEX REFLECTION COEFFICIENT USING A FOUR-PORT REFLECTOMETER作者机构:Institute of Antennas and EMS Xidian University Xi’an
出 版 物:《Journal of Electronics(China)》 (电子科学学刊(英文版))
年 卷 期:2001年第18卷第4期
页 面:359-362页
学科分类:0809[工学-电子科学与技术(可授工学、理学学位)] 08[工学]
主 题:Reflection coefficient Four-port Reflectometer
摘 要:A novel method for precise measurement of complex reflection coeffcient using a four-port reflectometer is presented. First, three new complex system constants are introduced,which depend only on the scattering parameters of the four-port reflectometer. Therefore, the stability of the reflectometer is greatly improved. Then, these complex system constants are used to determine the complex reflection coeffcient F of the device under test by calibrating the reflectometer. Finally, a four-port reflectometer comprising a magic tee and a power detector is constructed and excellent experimental results are obtained.