Optical properties of amorphous thin film of Se-Te-Ag system prepared by using thermal evaporation technique

作     者：Madhu MISHRA Rashmi CHAUHAN Anju KATIYAR K.K.SRIVASTAVA 

作者机构：Department of PhysicsDayanand Braiendra Swarup D.B.S.(P.G.) CollegeKanpur(U.P.)India Department of PhysicsD.A-V.(P.G.) CollegeKanpur(U.P.)India Department of PhysicsDayanand Brajendra Swarup D.B.S.(P.G.) CollegeKanpur(U.P.)India 

出 版 物：《Progress in Natural Science:Materials International》 (自然科学进展·国际材料(英文))

年 卷 期：2011年第21卷第1期

页      面：36-39页

核心收录：

学科分类：08[工学] 0803[工学-光学工程] 

基　　金：U. G. C.  New Delhi  India 

主　　题：chalcogenide thin film band gap optical constant 

摘      要：Optical reflection and transmission spectra of Se80-xTe20Agx(where x=0,5,10 and 15,molar percent) chalcogenide thin films have been obtained in the range 300-1 200 nm at room *** samples are prepared by melt quenching technique and thin films are obtained by using vacuum evaporation technique on glass transition at room *** present paper reports the effect of Ag contents on various optical parameters such as optical band gap,refractive index,extinction coefficient,absorption *** spectra are used for calculating these optical *** band gap Egis determined from the plot of (ahv)1/2versus *** and imaginary parts of the dielectric constant changes slightly with the variation of Ag contents in different *** film exhibits indirect band gap which increases with increasing Ag *** observed behavior is explained on the basis of Davis and Mott model for the density of *** absorption coefficient of thin films exhibits linear dependence on photon *** optical parameters are calculated by using theory of *** the optical parameters change with the variation of the film *** spectrophotometer JASCO-UV/VIS/NIR is used to determine optical constants.