Analysis, Design, and Test of CDMA LFSR with Offset Mask Using Standard ICs
Analysis, Design, and Test of CDMA LFSR with Offset Mask Using Standard ICs作者机构:Engineering Institute of Computer Science and Telecommunications (I3T) Dakar Senegal Department of Physics Faculty of Sciences and Techniques Cheikh Anta Diop University Dakar Senegal
出 版 物:《Engineering(科研)》 (工程(英文)(1947-3931))
年 卷 期:2016年第8卷第4期
页 面:226-231页
学科分类:0809[工学-电子科学与技术(可授工学、理学学位)] 08[工学]
主 题:LFSR CDMA DS-CDMA PCB FPGA Integrated Circuit (IC) Spread Spectrum (SS) Modular Shift Register (MSRG)
摘 要:Hardware implementation of Linear Feedback Shift Register (LFSR) plays a great and very important role in communication systems, and in many security devices. In this paper, a design of LFSR with offset mask has been presented, for Direct Sequence Code Division Multiple Access (DS-CDMA) applications. Integrated electronic components have been used. An accessible model facilitating the synthesis on Printed Circuit Boards (PCB) and implementation on Field Programmable Gate Array (FPGA) is offered. In addition, a temporal and spectral analysis of the circuit is performed in order to validate the design. This latter facilitates the generation of pseudo-random codes based on LFSR and their integration into electronic systems.