Double-pass grating imaging spectrometer

作     者：Xin Meng Zhongming Yang Jinyu Du Guobin Fan 孟鑫;杨忠明;杜近宇;范国斌

作者机构：Science and Technology on Electronic Test & Measurement Laboratory The 41st Research Institute of CETC School of Information Science & Engineering and Shandong Provincial Key Laboratory of Laser Technology and Application Shandong University Institute of Applied Electronics China Academy of Engineering Physics 

出 版 物：《Chinese Optics Letters》 (中国光学快报（英文版）)

年 卷 期：2019年第17卷第1期

页      面：43-46页

核心收录：

学科分类：08[工学] 0803[工学-光学工程] 

基　　金：partially supported by the Natural Science Foundation of Anhui Province(No.1808085QF201) the China Postdoctoral Science Foundation(No.2018M630773) the Fundamental Research Funds of Shandong University(No.11170077614092) 

主　　题：Double-pass imaging spectrometer 

摘      要：A double-pass grating imaging spectrometer is proposed and demonstrated. The traditional entrance slit is replaced by a middle reflective slit, which is used as a spectral filter rather than a spatial filter. The light from the scene passes through the same dispersive grating twice. The full image of the scene can be obtained with a snapshot. Therefore, the stripe noise and image distortion caused by image mosaicking can be ***, the target is easier to be captured and focused, just like using a camera. This method can be used to obtain clearer spectral images of the scene conveniently and quickly.