Local electrical charac terization of t wo-dimensional mat erials with functional atomic force microscopy
有功能的原子力量显微镜学的二维的材料的本地电的描述作者机构：CAS Key Laboratory of Standardization and Measurement for Nanotechnology CAS Center for Excellence in Nanoscience National Center for Nanoscience and Technology Beijing 100190 China Department of Physics and Beijing Key Laboratory of Optoelectronic Functional Materials & Micro-nano Devices Renmin University of China Beijing 100872 China University of Chinese Academy of Sciences Beijing 100049 China
出 版 物：《Frontiers of physics》 (物理学前沿（英文版）)
年 卷 期：2019年第14卷第3期
页 面：85-105页
核心收录：
基 金：the National Natural Science Foundation of China (NSFC)(Nos. 21622304, 61674045, and 11604063) the Ministry of Science and Technology (MOST) of China (No. 2016YFA0200700) the Strategic Priority Research Program, the Key Research Program of Frontier Sciences and Instrument Developing Project of Chinese Academy of Sciences (CAS)(Nos. XDB30000000, QYZDB-SSW-SYS031, and YZ201418) Osaka University's International Joint Research Promotion Program (Nos. J171013014 and J171013007) Z.H. Cheng was supported by Distinguished Technical Talents Project and Youth Innovation Promotion Association CAS, the Fundamental Research Funds for the Central Universities and the Research Funds of Renmin University of China (No. 18XNLG01)
主 题：advanced AFM techniques nanoscale characteTization electrical properties 2D materials
摘 要：Research about two-dimensional (2D) materials is growing exponentially across various scientific and engineering disciplines due to the wealth of unusual physical phenomena that occur when charge transport is confined to a plane. The applications of 2D materials are highly affected by the electrical properties of these mat erials, including curren t dist ribution, surface pot ential, dielectric response, conductivity, perm计tivity, and piezoelectric response. Hence, it is very crucial to characterize these properties at the nanoscale. The Atomic Force Microscopy (AFM)-based techniques are powerful tools that can simultaneously characterize morphology and electrical properties of 2D materials with high spatial resolution, thus being more and more extensively used in this research field. Here, the principles of these AFM techniques are reviewed in detail. After that, their representative applications are further demonstrated in the local characterization of various 2D materials? elcctrical properties.
维普期刊数据库