Effect of annealing process on structures and ferroelectric properties of Ca_(0.4)Sr_(0.6)Bi_(3.95)Nd_(0.05)Ti_4O_(15) thin films

作     者：范素华 张伟 王培吉 张丰庆 冯博楷 

作者机构：Department of Materials Science and EngineeringShandong Jianzhu UniversityJinan 250101China Department of ScienceJinan UniversityJinan 250022China 

出 版 物：《Journal of Rare Earths》 (稀土学报（英文版）)

年 卷 期：2009年第27卷第2期

页      面：216-221页

核心收录：

学科分类：0709[理学-地质学] 0819[工学-矿业工程] 07[理学] 070205[理学-凝聚态物理] 08[工学] 0708[理学-地球物理学] 080501[工学-材料物理与化学] 0805[工学-材料科学与工程（可授工学、理学学位）] 0703[理学-化学] 0702[理学-物理学] 

基　　金：supported by the Natural Science Foundation of Shandong Province (Y2007F36) the National Natural Science Foundation of China (50872075) 

主　　题：Ca0.4Sr0.6Bi3.95Nd0.05Ti4O15 thin films annealing process ferroelectric properties rare earths 

摘      要：Ca0.4Sr0.6Bi3.95Nd0.05Ti4O15 （C0.4S0.6BNT） ferroelectric thin films were prepared on Pt/Ti/SiO2/Si substrates by sol-gel method. Effect of annealing process （time and temperature） on structures and ferroelectric properties of C0.4S0.6BNT thin film was investigated. The relative intensity of （200） peak increased first then decreased with annealing temperature and became predominant at 800 ℃. In contrast, no evident change could be observed in the （001） peak. The remnant polarization （Pr） and coercive field （Ec） for C0.4S0.6BNT film annealed at 800℃ for 5 min were 21.6μC/cm2 and 68.3 kV/cm, respectively.