Preparation,Characterization and Electronic Properties of Fluorine-doped Tin Oxide Films
Preparation,Characterization and Electronic Properties of Fluorine-doped Tin Oxide Films作者机构:Deptartment of Materials and Metallurgical EngineeringNational Polytechnic Institute Nanosciences and Micro and Nanotechnology CenterNational Polytechnic Institute State Key Laboratory of Advanced Technology for Materials Synthesis and ProcessingWuhan University of Technology
出 版 物:《Journal of Wuhan University of Technology(Materials Science)》 (武汉理工大学学报(材料科学英文版))
年 卷 期:2016年第31卷第1期
页 面:48-51页
核心收录:
学科分类:081702[工学-化学工艺] 07[理学] 070205[理学-凝聚态物理] 08[工学] 0817[工学-化学工程与技术] 080501[工学-材料物理与化学] 0805[工学-材料科学与工程(可授工学、理学学位)] 0702[理学-物理学]
主 题:tin oxide films fluorine doping energy band diagram
摘 要:Tin oxide(SnO2) and fluorine doped tin oxide(FTO) films were prepared on glass substrates by sol-gel spin-coating using SnCl4 and NH4F *** doping concentration was fixed at 4 at%and 20 at%by controlling precursor sol *** exhibited the tetragonal rutile-type crystal structure regardless of fluorine *** and highly transparent FTO films,with more than 85%of optical transmittance,were obtained by annealing at 600℃.Florine doping of films was verified by analyzing the valence band region obtained by *** was found that the fluorine doping affects the shape of valence band of SnO2 *** addition,it was observed that the band gap of SnO2 is reduced as well as the Fermi level is upward shifted by the effect of fluorine doping.