Nanoscopic imaging of oxidized graphene monolayer using tip-enhanced Raman scattering.

作     者：Joseph M.Smolsky Alexey V.Krasnoslobodtsev 

作者机构：Department of PhysicsUniversity of Nebraska at Omaha6001Dodge StreetOmaha NE 68182USA 

出 版 物：《Nano Research》 (纳米研究（英文版）)

年 卷 期：2018年第11卷第12期

页      面：6346-6359页

核心收录：

学科分类：07[理学] 0702[理学-物理学] 

基　　金：supported by the following NIGMS Funds for Undergraduate Scholarly Experiences from the Office of Research and Creative Activity at UNO to J. M. S 

主　　题：graphene Raman spectroscopy tip-enhanced Raman scattering graphene oxidation 

摘      要：Tip-enhanced Raman scattering (TERS) can be used for the structural and chemical characterization of materials with a nanoscale resolution, and offers numerous advantages compared to other forms of imaging. We use TERS to track the local structural features of a CVD-grown graphene monolayer. Ag nanoparticles were added to AFM probes using ion-beam sputtering in order to make them TERS-active. Such modification provides probes with large factors of enhancement and good reproducibility. TERS measurements on graphene show an emergence of a defect-induced D-Raman band and a strain-induced shoulder of the graphene’s G-band. Comparison of TERS results with micro-Raman for oxidized graphene suggests that local oxidation occurs with the introduction of sp3 defects, under TERS conditions.