Review on Fault-Tolerant NoC Designs

作     者：Jun-Shi Wang Le-Tian Huang 

作者机构：the School of Electronic Science and EngineeringUniversity of Electronic Science and Technology of ChinaChengdu 611731 Beijing Zhaoxin Electronic Technology Co.Ltd.Beijing 100084 the School of Electronic Science and EngineeringUniversity of Electronic Science and Technology of ChinaChengdu 610054 

出 版 物：《Journal of Electronic Science and Technology》 (电子科技学刊（英文版）)

年 卷 期：2018年第16卷第3期

页      面：191-221页

核心收录：

学科分类：070208[理学-无线电物理] 07[理学] 0702[理学-物理学] 

基　　金：supported by the National Natural Science Foundation of China under Grants No.61534002,and No.61701095 the Fundamental Research Funds for the Central Universities under Grant No.ZYGX2016J042 

主　　题：Fault diagnosis fault recovery fault-tolerant network-on-chip 

摘      要：By benefiting from the development of the semiconductor technology, many-core system-on-chips(SoCs)have been widely used in electronic devices. Network-on-chips(NoCs) can address the massive stress of on-chip communications due to the advantages of high bandwidth, low latency, and good flexibility. Since deep sub-micron era, the reliability has become a critical constraint for integrated circuits. To provide correct data transmission, faulttolerant NoCs have been researched widely in last decades, and many valuable designs have been proposed. This work introduces and summarizes the state-of-the-art technologies for fault diagnosis and fault recovery in faulttolerant NoCs. Moreover, this work makes prospects for the future’s research.