Production of highly charged argon ions from a room temperature electron beam ion trap

作     者：王铁山 彭海波 Ovsyannikov V P Kentsch U Ullmann F 程锐 Zschornack G 

作者机构：School of Nuclear Science and TechnologyLanzhou UniversityLanzhou 730000China DREEBIT GmbHZur Wetterwarte 50D-01109 DresdenGermany Technische Universitt DresdenInstitute of Applied PhysicsDresden D-01069Germany 

出 版 物：《Chinese Physics C》 (中国物理C（英文版）)

年 卷 期：2008年第32卷第5期

页      面：389-392页

核心收录：

学科分类：0709[理学-地质学] 07[理学] 0708[理学-地球物理学] 0804[工学-仪器科学与技术] 0827[工学-核科学与技术] 0703[理学-化学] 0704[理学-天文学] 070202[理学-粒子物理与原子核物理] 0702[理学-物理学] 

基　　金：National Natural Science Foundation of China(10475035) 

主　　题：EBIS highly charged ion ionization time 

摘      要：In this work, highly charged ions have been extracted from the advanced Electron Beam Ion Source （EBIS-A） developed in a scientific cooperation between the Dresden University of Technology and the DREEBIT GmbH Dresden. The charge state distributions of ions extracted from the EBIS-A are measured in the pulse and leaky modes under different operation conditions. Aris＋ ions with current of 2 pA are produced and extracted in the leaky mode. 3×10^5 Ar^18＋ ions per pulse are extracted in the pulse mode. The ion charge state distribution is a function of the ionization time.